Translating Compressed Scan Patterns to Standard Scan Mode Patterns.

Translating Compressed Scan Patterns to Standard Scan Mode Patterns.

You can use the TetraMAX tool to convert compressed scan mode patterns to standard scan mode patterns.

The translation is performed by writing out a netlist-independent version of the pattern in binary format along with the normal compressed scan pattern set. The netlist-independent pattern file contains a mapping of the scan cells and primary inputs to their ATPG-generated values. This pattern set can be read back into the TetraMAX tool after the design is placed into reconfigured standard scan mode by reading the standard scan mode SPF. After the patterns are read back in, a simulation is performed internally to compute the standard scan expected values. The resulting internal patterns can then be written out for the tester to be used in reconfigured scan mode for diagnosis.
This translation flow applies to normal compressed scan mode patterns, and parallel mode and serial mode patterns from designs with serialized scan compression.
To use this pattern translation flow, perform the following steps:

1. Read in the design and apply the compressed scan SPF.
   # read in design
   run_build_model ...
   # read SPF for compressed scan mode
   run_drc scan_compression.spf
   run_atpg -auto_compression
2. Create test patterns,and write them out inbinary format for diagnostics.
   # create patterns
   run_atpg -auto_compression
   # write out binary compressed scan mode patterns for diagnostics
   write_patterns compressed_pat.bin -format binary
3. Write out the patterns in the netlist-independent pattern format for translation.
   # write netlist-independent patterns that can be translated set_patterns -netlist_independent
   write_patterns compressed_pat_net_ind.bin
4. In a new TetraMAX run,read in the design and apply the standard scan SPF.
   # read in design
   run_build_model ...
   # read SPF for standard scan mode
   run_drc standard_scan.spf
5. Read in the netlist-independent pattern file.
   # read_netlist-independent patterns
   set_patterns external compressed_pat_net_ind.bin
6. Optionally,run simulation to confirm that the patterns pass.
   # optional sanity check to verify that simulation passes
   run_simulation
7. Write out the translated standard scan patterns in binary format for diagnostics.
   # write out translated patterns in binary format for diagnostics
   write_patterns scan_pat.bin -external -format binary
8. Write out the patterns in the required output format for the tester.
   # write out translated patterns in binary format for diagnostics
   write_patterns scan_pat.pats -external -format tester_format
The following limitations apply when translating compressed scan patterns to standard scan patterns:
• You cannot translate standard scan patterns back into compressed scan patterns.
• Pattern translation supports only Basic-Scan and Fast-Sequential patterns. This limitation is similar to diagnosis.
• Scan logic configuration differences between the compressed scan mode and the standard scan mode might result in slightly different coverage numbers.
• Netlist-independent patterns are stored in multiples of 200, as shown in the following example:
BUILD-T> set_patterns -netlist_independent
TEST-T> write_patterns pats.bin -format binary -serial -replace
200 netlist independent patterns were stored, CPU_time=0.00
400 netlist independent patterns were stored, CPU_time=0.00
End writing file 'pats.bin' with 426 patterns, File_size = 1047744, CPU_time = 0.0 sec.