FORCE “primary_input_pin” <value> <time>;
此命令用于在给定时间强制选定主输入引脚上的值(0,1、X或Z)。时间值不得低于该程序的先前时间值。每个程序的时间在时间0再次开始。主输入引脚将用双引号括起来。
APPLY “scan_group_procedure_name” <#times> <time>;
此命令指示所选程序名称将从所选时间开始应用所选次数。扫描组过程名称将用双引号括起来。此命令只能在加载和卸载过程中使用。
FORCE_SCI “scan_chain_name” <time>;
该命令指示移位过程中的时间,值将被放置在扫描链输入上。扫描链名称将用双引号括起来。
MEASURE_SCO “scan_chain_name” <time>;
该命令指示移位过程中扫描链输出上测量值的时间。扫描链名称将用双引号括起来。
Functional_Chain_Test
functional_chain_test部分包含要测试电路中所有扫描链的功能扫描链测试的定义。对于每个扫描链组,扫描链测试将包括加载交替的双0和双1(00110011…),然后卸载组中所有扫描链的这些值。
The format is as follows:
CHAIN_TEST =
APPLY “test_setup” <value> <time>;
PATTERN = <number>;
APPLY “scan_group_load_name” <time> =
CHAIN “scan_chain_name1” = “values....”;
CHAIN “scan_chain_name2” = “values....”;
....
....
END;
APPLY “scan_group_unload_name” <time> =
CHAIN “scan_chain_name1” = “values....”;
CHAIN “scan_chain_name2” = “values....”;
....
....
END;
END;
如果setup_Data部分中有测试设置过程,则在功能链测试模式的开头应用可选的“test_setup”行。pattern的编号是从零开始的pattern编号,其中要测试电路中所有扫描链的功能扫描链测试。扫描组加载和卸载名称以及扫描链名称将用双引号括起来。加载和卸载扫描链的值将用双引号括起来。在扫描链加载期间,相应扫描链的每个值都将放置在其扫描链输入引脚上。移位程序将通过扫描链移位值,并继续移位下一个值,直到所有扫描链的所有值都已加载。由于移位的数量由最长扫描链的长度决定,所以X(不必在意)放在较短扫描链的开头。这将确保正确加载扫描链的所有值。在扫描链卸载期间,将在其扫描链输出引脚处测量相应扫描链的每个值。移位程序将值移出扫描链,并继续移位下一个值,直到所有扫描链的所有值都已卸载。同样,由于移位的数量由最长扫描链的长度决定,所以X(不测量)位于较短扫描链的末端。这将确保扫描链的所有值都将被快速卸载。
CHAIN_TEST =
APPLY “test_setup” 1 0;
PATTERN = 0;
APPLY “g1_load” 0 =
CHAIN “c2” = “XXXXXXXXX0011001100110011001100”;
CHAIN “c1” = “XXXXXXXXXXXXX001100110011001100”;
CHAIN “c0” = “0011001100110011001100110011001”;
END;
APPLY “g1_unload” 1 =
CHAIN “c2” = “0011001100110011001100XXXXXXXXX”;
CHAIN “c1” = “001100110011001100XXXXXXXXXXXXX”;
CHAIN “c0” = “0011001100110011001100110011001”
END;
END;
Scan_Test
The scan_test section contains the definition of the scan test patterns that were created by
Tessent Shell.
A scan pattern will normally include the following:
SCAN_TEST =
PATTERN = <number>;
FORCE “PI” “primary_input_values” <time>;