lcd驱动芯片测试软件,大电容负载LCD驱动芯片的测试及性能改进

摘要：

This paper proposed a test scheme for a dedicated, multi-channel, large capacitor load LCD driver chip. The 12.5 MHz basic clock, control vectors for state change and frame frequency selection are provided by the FPGA, decreasing data is written to registers in the chip. With 200 pF capacitive load, the output signal range can realize 1 024 gray level and over 12 V voltage swing. Through testing the DAC and output buffer module in the chip, it is found that charging speed of the buffer to miller capacitor and the DAC to sampling capacitor cause the problem of longer full-swing rising/falling time and nonlinear output. It can be improved by reducing the on-chip convert resister or sampling capacitor to some extent. Finally, an improvement scheme is proposed, which uses switched-capacitor DAC and Class-AB output buffer error amplifier.

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