linux+disk+read+error,linux – S.M.A.R.T.以前的硬盘错误还是需要更换?

我跑了s.m.a.r.t并想出了一些奇怪的错误,虽然磁盘非常新鲜Power_On_Minutes 427h 41m

我很好奇,这些是以前硬盘的错误吗?

Error 1 occurred at disk power-on lifetime: 13729 hours (572 days + 1 hours)

When the command that caused the error occurred,the device was active or idle

Error 2 occurred at disk power-on lifetime: 23300 hours (970 days + 20 hours)

When the command that caused the error occurred,the device was active or idle.

这是输出

# smartctl --all /dev/sda

smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.4.0-51-generic] (local build)

Copyright (C) 2002-16,Bruce Allen,Christian Franke,www.smartmontools.org

=== START OF INFORMATION SECTION ===

Model Family: Toshiba 2.5" HDD MK..76GSX

Device Model: TOSHIBA MK2576GSX

Serial Number: Y1J9S0IGS

LU WWN Device Id: 5 000039 3a5a06b8e

Firmware Version: GS001A

User Capacity: 250,059,350,016 bytes [250 GB]

Sector Size: 512 bytes logical/physical

Rotation Rate: 5400 rpm

Form Factor: 2.5 inches

Device is: In smartctl database [for details use: -P show]

ATA Version is: ATA8-ACS (minor revision not indicated)

SATA Version is: SATA 2.6,3.0 Gb/s (current: 3.0 Gb/s)

Local Time is: Thu Dec 1 00:28:22 2016 GMT

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status: (0x00) Offline data collection activity

was never started.

Auto Offline Data Collection: Disabled.

Self-test execution status: ( 0) The prevIoUs self-test routine completed

without error or no self-test has ever

been run.

Total time to complete Offline

data collection: ( 120) seconds.

Offline data collection

capabilities: (0x5b) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Suspend Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

No Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time: ( 2) minutes.

Extended self-test routine

recommended polling time: ( 81) minutes.

SCT capabilities: (0x003d) SCT Status supported.

SCT Error Recovery Control supported.

SCT Feature Control supported.

SCT Data Table supported.

SMART Attributes Data Structure revision number: 16

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_Failed RAW_VALUE

1 Raw_Read_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0

2 Throughput_Performance 0x0005 100 100 050 Pre-fail Offline - 0

3 Spin_Up_Time 0x0027 100 100 001 Pre-fail Always - 1229

4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 15

5 Reallocated_Sector_Ct 0x0033 100 100 050 Pre-fail Always - 0

7 Seek_Error_Rate 0x000b 100 100 050 Pre-fail Always - 0

8 Seek_Time_Performance 0x0005 100 100 050 Pre-fail Offline - 0

9 Power_On_Minutes 0x0032 036 036 000 Old_age Always - 427h+41m

10 Spin_Retry_Count 0x0033 100 100 030 Pre-fail Always - 0

12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 7

191 G-Sense_Error_Rate 0x0032 100 100 000 Old_age Always - 0

192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 1

193 Load_Cycle_Count 0x0032 070 070 000 Old_age Always - 304324

194 Temperature_Celsius 0x0022 100 100 000 Old_age Always - 27 (Min/Max 20/31)

196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0

197 Current_Pending_Sector 0x0032 100 100 000 Old_age Always - 0

198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0

199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 2

220 Disk_Shift 0x0002 100 100 000 Old_age Always - 109

222 Loaded_Hours 0x0032 067 067 000 Old_age Always - 13230

223 Load_Retry_Count 0x0032 100 100 000 Old_age Always - 0

224 Load_Friction 0x0022 100 100 000 Old_age Always - 0

226 Load-in_Time 0x0026 100 100 000 Old_age Always - 375

240 Head_Flying_Hours 0x0001 100 100 001 Pre-fail Offline - 0

SMART Error Log Version: 1

ATA Error Count: 2

CR = Command Register [HEX]

FR = Features Register [HEX]

SC = Sector Count Register [HEX]

SN = Sector Number Register [HEX]

CL = Cylinder Low Register [HEX]

CH = Cylinder High Register [HEX]

DH = Device/Head Register [HEX]

DC = Device Command Register [HEX]

ER = Error register [HEX]

ST = Status register [HEX]

Powered_Up_Time is measured from power on,and printed as

DDd+hh:mm:SS.sss where DD=days,hh=hours,mm=minutes,SS=sec,and sss=millisec. It "wraps" after 49.710 days.

Error 2 occurred at disk power-on lifetime: 23300 hours (970 days + 20 hours)

When the command that caused the error occurred,the device was active or idle.

After command completion occurred,registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

84 51 01 1f 7a 05 e0 Error: ICRC,ABRT 1 sectors at LBA = 0x00057a1f = 358943

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

35 00 00 20 76 05 e0 00 6d+01:49:26.915 WRITE DMA EXT

35 00 00 00 72 05 e0 00 6d+01:49:26.741 WRITE DMA EXT

35 00 08 80 0f 0c e0 00 6d+01:49:26.741 WRITE DMA EXT

35 00 08 48 8a c4 e0 00 6d+01:49:26.741 WRITE DMA EXT

ca 00 08 00 08 14 e9 00 6d+01:49:26.741 WRITE DMA

Error 1 occurred at disk power-on lifetime: 13729 hours (572 days + 1 hours)

When the command that caused the error occurred,registers were:

ER ST SC SN CL CH DH

-- -- -- -- -- -- --

84 51 01 3f 8c 4e e0 Error: ICRC,ABRT 1 sectors at LBA = 0x004e8c3f = 5147711

Commands leading to the command that caused the error were:

CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name

-- -- -- -- -- -- -- -- ---------------- --------------------

35 00 00 40 88 4e e0 00 12d+21:23:20.732 WRITE DMA EXT

ca 00 08 a8 48 c8 e3 00 12d+21:23:20.731 WRITE DMA

35 00 08 40 c1 1d e0 00 12d+21:23:20.731 WRITE DMA EXT

35 00 08 b0 19 14 e0 00 12d+21:23:20.731 WRITE DMA EXT

35 00 10 28 bf 13 e0 00 12d+21:23:20.731 WRITE DMA EXT

SMART Self-test log structure revision number 1

No self-tests have been logged. [To run self-tests,use: smartctl -t]

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing

2 0 0 Not_testing

3 0 0 Not_testing

4 0 0 Not_testing

5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans,do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up,resume after 0 minute delay.

这个硬盘可能很快就会发生故障并需要更换吗?

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