硬件检测工具 linux,Linux硬件检测工具

Linux下的硬件检测和识别软件，做得比较完善了。选购Laptop，如果是自带Linux系统，完全可以用它们来检测硬件。

首先出场的当然是：

1. dmidecode www.nongnu.org/dmidecode/

检测SMBIOS/DMI的信息，实际上按SMBIOS手册上的每一条，都dump出来，包括主板芯片，CPU标识，内存大小，硬盘信息等。

这个程序被很多项目吸取，包括lshw等。

还记得Win32下的CPU-Z软件么，它与上面的dmidecode相比，多了SPD信息获取的功能。别急，Linux下也有，它就是──

2. decode-dimms http://ornellas.apanela.com/dokuwiki/pub:spd

依赖

提供的eeprom驱动模块，在内核2.6.5以上的内核，源码在drivers/i2c/chips/eeprom.c 文件中。

#modprobe eeprom

decode-dimms实际是个perl脚本，包含在

内的文件包中。

我的Laptop上运行

#decode-dimms

结果是：

# decode-dimms version 5164 (2008-03-26 14:48:21 +0100)

Memory Serial Presence Detect Decoder

By Philip Edelbrock, Christian Zuckschwerdt, Burkart Lingner,

Jean Delvare, Trent Piepho and others

Decoding EEPROM: /sys/bus/i2c/drivers/eeprom/0-0052

Guessing DIMM is in bank 3

---=== SPD EEPROM Information ===---

EEPROM Checksum of bytes 0-62 OK (0x09)

# of bytes written to SDRAM EEPROM 128

Total number of bytes in EEPROM 256

Fundamental Memory type DDR2 SDRAM

SPD Revision 1.2

---=== Memory Characteristics ===---

Maximum module speed 666MHz (PC2-5300)

Size 1024 MB

Banks x Rows x Columns x Bits 8 x 14 x 10 x 64

Ranks 1

SDRAM Device Width 8 bits

Module Height 30.0 mm

Module Type SO-DIMM (67.6 mm)

DRAM Package Planar

Voltage Interface Level SSTL 1.8V

Refresh Rate Reduced (7.8 us) - Self Refresh

Supported Burst Lengths 4, 8

tCL-tRCD-tRP-tRAS 5-5-5-14

Supported CAS Latencies (tCL) 5T, 4T, 3T

Minimum Cycle Time at CAS 5 (tCK min) 3.00 ns

Maximum Access Time at CAS 5 (tAC) 0.45 ns

Minimum Cycle Time at CAS 4 3.75 ns

Maximum Access Time at CAS 4 0.50 ns

Minimum Cycle Time at CAS 3 5.00 ns

Maximum Access Time at CAS 3 0.60 ns

Maximum Cycle Time (tCK max) 8.00 ns

---=== Timing Parameters ===---

Address/Command Setup Time Before Clock (tIS) 0.20 ns

Address/Command Hold Time After Clock (tIH) 0.27 ns

Data Input Setup Time Before Strobe (tDS) 0.10 ns

Data Input Hold Time After Strobe (tDH) 0.17 ns

Minimum Row Precharge Delay (tRP) 15.00 ns

Minimum Row Active to Row Active Delay (tRRD) 7.50 ns

Minimum RAS# to CAS# Delay (tRCD) 15.00 ns

Minimum RAS# Pulse Width (tRAS) 40.00 ns

Write Recovery Time (tWR) 15.00 ns

Minimum Write to Read CMD Delay (tWTR) 7.50 ns

Minimum Read to Pre-charge CMD Delay (tRTP) 7.50 ns

Minimum Active to Auto-refresh Delay (tRC) 55.00 ns

Minimum Recovery Delay (tRFC) 127.50 ns

Maximum DQS to DQ Skew (tDQSQ) 0.24 ns

Maximum Read Data Hold Skew (tQHS) 0.34 ns

---=== Manufacturing Information ===---

Manufacturer Ramaxel Technology

Manufacturing Location Code 0x01

Part Number RMN1150ME48D7F-667

Revision Code 0x4100

Number of SDRAM DIMMs detected and decoded: 1

可见，SPD信息都能探测出来。

验证Laptop是否全新，有一个重要依据──硬盘的上电时间。Linux下也有探测工具，就如HD Tune的最有用功能。它就是──

3. smartmontools

# ./smartctl --all /dev/sda

smartctl version 5.38 [i686-pc-linux-gnu] Copyright (C) 2002-8 Bruce Allen

Home page is http://smartmontools.sourceforge.net/

=== START OF INFORMATION SECTION ===

Device Model: Hitachi HTS542525K9SA00

Serial Number: 080617BB6F00WDJLMP8F

Firmware Version: BBFOC31P

User Capacity: 250,059,350,016 bytes

Device is: Not in smartctl database [for details use: -P showall]

ATA Version is: 8

ATA Standard is: ATA-8-ACS revision 3f

Local Time is: Thu Oct 16 20:41:17 2008 UTC

SMART support is: Available - device has SMART capability.

SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===

SMART overall-health self-assessment test result: PASSED

General SMART Values:

Offline data collection status: (0x00) Offline data collection activity

was never started.

Auto Offline Data Collection: Disabled.

Self-test execution status: ( 0) The previous self-test routine completed

without error or no self-test has ever

been run.

Total time to complete Offline

data collection: ( 645) seconds.

Offline data collection

capabilities: (0x5b) SMART execute Offline immediate.

Auto Offline data collection on/off support.

Suspend Offline collection upon new

command.

Offline surface scan supported.

Self-test supported.

No Conveyance Self-test supported.

Selective Self-test supported.

SMART capabilities: (0x0003) Saves SMART data before entering

power-saving mode.

Supports SMART auto save timer.

Error logging capability: (0x01) Error logging supported.

General Purpose Logging supported.

Short self-test routine

recommended polling time: ( 2) minutes.

Extended self-test routine

recommended polling time: ( 107) minutes.

SCT capabilities: (0x003d) SCT Status supported.

SCT Feature Control supported.

SCT Data Table supported.

SMART Attributes Data Structure revision number: 16

Vendor Specific SMART Attributes with Thresholds:

ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE

1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0

2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0

3 Spin_Up_Time 0x0007 253 253 033 Pre-fail Always - 1

4 Start_Stop_Count 0x0012 100 100 000 Old_age Always - 254

5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0

7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0

8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0

9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 295

10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0

12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 254

191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0

192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 4718598

193 Load_Cycle_Count 0x0012 100 100 000 Old_age Always - 4577

194 Temperature_Celsius 0x0002 144 144 000 Old_age Always - 38 (Lifetime Min/Max 22/47)

196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0

197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0

198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0

199 UDMA_CRC_Error_Count 0x000a 200 200 000 Old_age Always - 0

223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0

SMART Error Log Version: 1

No Errors Logged

SMART Self-test log structure revision number 1

No self-tests have been logged. [To run self-tests, use: smartctl -t]

SMART Selective self-test log data structure revision number 1

SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS

1 0 0 Not_testing

2 0 0 Not_testing

3 0 0 Not_testing

4 0 0 Not_testing

5 0 0 Not_testing

Selective self-test flags (0x0):

After scanning selected spans, do NOT read-scan remainder of disk.

If Selective self-test is pending on power-up, resume after 0 minute delay.

还想要Nokia测试屏幕坏点、亮点的工具？有！

4. screentest http://www.fi.muni.cz/~kas/screentest/

功能类似，图像化界面。

我就想到这些测试项目了，当然，还需要配以经典的lspci和lsusb吧。

还有别的么？请提醒我一下：-)