湖南大学计算机与通信学院,邝继顺-湖大信息科学与工程学院

[01]Liu Tieqiao, Kuang Jishun*, Cai Shuo, You Zhiqiang. An Efficient Small-Delay Faults Simulator Based on Critical Path Tracing. International Journal of Circuit Theory and Applications. (Accepted)

[02]Liu Tieqiao, Kuang Jishun*, Cai Shuo, You Zhiqiang. An Effective Logic BIST Scheme Based on LFSR-Reseeding and TVAC. International Journal of Electronics. (Accepted)

[03]Liu Tieqiao, Kuang Jishun*, You Zhiqiang, Cai Shuo. An Effective Deterministic Test Generation for Test-Per-Clock Testing. IEEE Aerospace & Electronic Systems Magazine. (Accepted)

[04]蔡烁，邝继顺*，刘铁桥，王伟征. 考虑信号相关性的逻辑电路可靠度计算方法. 电子学报. 已接收，将于2014年8月发表.

[05]夏静，邝继顺*等．SER-Tvpack：基于软错误率评估的SRAM型 FPGA装箱算法．计算机研究与发展. 已接收，将于2014年发表.

[06]刘铁桥，邝继顺*，蔡烁，尤志强. 一种将测试集嵌入到Test-Per-Clock位流中的方法. 计算机研究与发展. 已接收，将于2014年第51卷发表.

[07]蔡烁，邝继顺*，刘铁桥，周颖波．一种高效的门级电路可靠度估算方法．电子与信息学报，35(5)：1262-1266,2013．

[08]张玲,邝继顺*,林静,梅军进.数字微流控生物芯片并行在线测试.上海交通大学学报,  47(1):98-102,2013.

[09]Weizheng Wang, Jishun Kuang*, Peng Liu, Xin Peng, Zhiqiang You. Switching activity reduction for scan-based BIST using weighted scan input data. IEICE Electronics Express, 9(10), pp. 874-880, 2012.

[10]L. Zhang, J.S KUANG* and Z.Q.YOU, Virtual scan chains reorder using a RAM-based module for high test compression. Microelectronics Journal, 43(11), pp. 869-872, 2012.

[11]皮霄林,邝继顺*,张玲.一种新的小时延测试向量筛选方法.电子测量与仪器仪表学报, 26(3):242-247,2012.

[12]Weizheng Wang, Jishun Kuang*, Zhiqiang You. Achieving Low Capture and Shift Power in Linear Decompressor-Based Test Compression Environment. Microelectronics Journal, 43(2), pp. 134-140, 2012.

[13]邝继顺*,靳立运,王伟征,尤志强.减少自反馈测试硬件代价的两种方法.计算机研究与发展,49(4):880-886,2012.

[14]王伟征,邝继顺*,尤志强,刘鹏.一种基于扫描子链轮流扫描捕获的低费用BIST方法.计算机研究与发展,49(4):864-872,2012.

[15]Ling Zhang, Jishun Kuang*, Zhiqqiang You. Test data compression using interval broadcast scan for embedded cores. Microelectronics Journal, 42(11), pp. 1313-13192011, 2011.

[16]Weizheng Wang, Jishun Kuang*, Zhiqiang You, Peng Liu. Reducing Test-Data volume and Test-Power Simultaneously in LFSR Reseeding-based Compression Environment. Journal of Semiconductors, 32(7), pp. 075009(1)-075009(7), 2011.

[17]Weizheng Wang, Jishun Kuang*, Zhiqiang You. Low Power Compression in Linear Decompressor-Based Test Compression Environment. International Review on Computers and Software, 6(4), pp. 550-554, 2011.

[18]Tieqiao Liu, Jishun Kuang*, Weizheng Wang, Zhiqiang You, Shuo Cai. Embedding N-Detect Test Set into Controlled Bits Stream. International Journal of Digital Content Technology and Its Applications, 5(10), pp. 271-278, 2011.

[19]Ling Zhang, Jishun Kuang*, Zhiqiang You. Test Data Compression Using Selective Sparse Storage. J. Electron Test, 27(4), pp. 565-577, 2011.

[20]吴了,邝继顺*,马卓,郭苗苗.一种基于开关电容的斜坡产生与求和电路.仪器仪表学报, 32(1):144-149,2011.