摘要:
A novel technique for the objective assessment of particle shape is presented. The technique uses Fourier shape de- scriptors and image analysis of scanning electron microscope photographs of sand grains to provide an accurate quantifi- cation of particle morphology and texture. Three lower order Fourier descriptors, denoted 'signature descriptors', provide measures of elongation, triangularity and square- ness, while an additional descriptor, denoted 'asymmetry', provides a measure of particle irregularity.
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