摘要:
We have developed a general technique that is capable of providing molecular signatures as a function of depth in a multilayer thin film. Variable-angle internal-reflection Raman spectroscopy has been used to locate buried interfaces with nanometer-scale precision and to determine refractive indices to within +/-0.0001. We have demonstrated this method in several applications, including the detection of toluene diffusion across a polystyrene/poly(methyl methacrylate) interface. [S0163-1829(98)06307-3].
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