量产导入 | ATPG Test_coverage_faults

目标

Upon completion of this module, you should be able to:

• Explain how to include and exclude faults for ATPG
• Explain how detected and undetected faults are classified.
• Interpret the statistics information reported after pattern generation.
• Interpret information transcribed into log files and to the transcript window.

完成本模块后，您应该能够：

• 解释如何在自动测试图案生成（ATPG）中包含和排除故障
• 解释已检测和未检测到的故障是如何分类的
• 解释模式生成后报告的统计信息
• 解释记录到日志文件以及转录窗口中的信息

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Faults

Prior to test pattern generation, the tool performs circuit learning and determines:

• Fault Locations (external or internal to the gate level model)
• Total number of faults in design
• Specific fault types

You have the option to:

• specify fault locations in reference to gate level models.
• Add fault