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Semiconductor Reliability Handbook

Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design Rudolph Frederick Stapelberg Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design Rudolph Frederick Stapelberg Handbook of Reliability, Availability, Maintainability and Safety in Engineering Design 123 Rudolph Frederick Stapelberg, BScEng, MBA, PhD, DBA, PrEng Adjunct Professor Centre for Infrastructure and Engineering Management Griffith University Gold Coast Campus Q

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the devices’ operating condition in an accelerated way, and is primarily for device qualification and reliability monitoring. A form of high temperature bias life using a short duration, popularly known as burn-in, may be used to screen for infant mortality related failures. The detailed use and application of burn-in is outside the scope of this document. free for $54