【微光增强+缺陷检测+多次冻结训练】LE–MSFE–DDNet

@article{hu2022msfe,

  title={LE--MSFE--DDNet: a defect detection network based on low-light enhancement and multi-scale feature extraction},

  author={Hu, Weihua and Wang, Tao and Wang, Yangsai and Chen, ZiYang and Huang, Guoheng},

  journal={The Visual Computer},

  volume={38},

  number={11},

  pages={3731--3745},

  year={2022},

  publisher={Springer}

}

主要作者：Hu, Weihua and Wang, Tao and Wang, Yangsai and Chen, ZiYang and Huang, Guoheng

发表单位：

1.School of Automation, Guangdong University of Technology, Guangzhou, Guangdong, China

2.School of Computers, Guangdong University of Technology, Guangzhou, Guangdong, China

关键词：微光增强、缺陷检测

实验数据库：SICE:https://csjcai.github.io/papers/SICE.pdf