该研究通过时间分辨X射线微衍射技术，直观展示了Pb(Zr,Ti)O3电容器在极化翻转过程中的域墙运动。实验发现，极化翻转伴随着压电系数符号的反转和X射线反射强度的变化。域墙的传播在电场周期内高度可重复，速度约为40ms^-1，低于高电场下的饱和值。这一发现对于理解和模拟铁电材料的极化行为具有重要意义。
摘要：
Domain wall motion during polarization switching in ferroelectric thin films is fundamentally important and poses challenges for both experiments and modeling. We have visualized the switching of a Pb(Zr, Ti)O(3) capacitor using time-resolved x-ray microdiffraction. The structural signatures of switching include a reversal in the sign of the piezoelectric coefficient and a change in the intensity of x-ray reflections. The propagation of polarization domain walls is highly reproducible from cycle to cycle of the electric field. Domain wall velocities of 40 m s(-1) are consistent with the results of other methods, but are far less than saturation values expected at high electric fields.
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