2009 APS March Meeting
Volume 54, Number 1
Monday–Friday, March 16–20, 2009;
Pittsburgh, Pennsylvania
Session A36: Carbon Nanotubes: Electrical Transport and Noise
8:00 AM–11:00 AM,
Monday, March 16, 2009
Room: 408
Sponsoring
Unit:
DMP
Chair: Hui Tang, Yale University,
Abstract ID: BAPS.2009.MAR.A36.6
Abstract: A36.00006 : Theoretical Study of Multiple-Trap Correlations in Random Telegraph Signals of a Carbon Nanotube Field-Effect Transistor
9:00 AM–9:12 AM
Authors:
Smitha Vasudevan
(University of Virginia)
Jack Chan
Brian Burke
Kenneth Evans
Kamil Walczak
Mingguo Liu
Joe Campbell
Keith Williams
Avik Ghosh
We develop a theoretical model to explain the observation of high amplitude,
multiple-trap random telegraph signatures (RTS) in the electronic transport
of a one-dimensional field effect transistor (FET) with a carbon nanotube
channel. A unique RTS pattern is observed, with an initial strong blockade
of the current that continues over a well-defined bias window, and
subsequent reversal of the blockade through a separate RTS series. We
ascribe our observations to correlated electrostatic effects between
multiple charge traps along the channel, whereby one trap 'passivates' the
other purely electrostatically and without any direct chemical bond. We
present a robust quantum transport model that provides quantitative
validation of this hypothesis. We assert that this effect, which has not
been reported in bulk silicon devices, arises from the logarithmic
electrostatic potential profile of the 1-D channel that allows the trap
levels to slip past each other under the action of a remote gate, ultimately
reversing their energy hierarchy and annihilating each other. Our results
suggest that multiple-trap behavior in low-dimensional field-effect devices
may be adaptable for several new transistor and sensor technologies.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2009.MAR.A36.6