摘要：
Spatially resolved electron field emission measurements from a nanocrystalline diamond film grown by plasma‐enhanced chemical transport deposition have been obtained using a scanning probe apparatus with micrometer resolution. Macroscopic regions with a high emission site density, and turn‐on fields below 3 V/μm, comprised approximately 1/2 of the total sample area. The emitting and the nonemitting regions of the specimen are differentiated distinctly by Raman spectra and subtly by morphologies. Both areas are largelysp3‐bonded, but only the nonemitting regions exhibit a sharp line at 1332 cm−1, a well‐known signature of diamond in larger crystallites.
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