pattern修改后不能保存:RDI_configure文件中,参数SETUP_UPTODATE赋值修改为false。解释如下:Specify this option to TRUE to have NO * (asterisk) in the setuptool; or to FALSE to have * in the setuptool. The default value is FALSE.
Short description: Number of testpoints per pin
Values: Default:10000
Maximum:1048576
Change Device wizard: Testpoints
DSCP command: n/a
Note: This parameter has the biggest influence on the memoryusage and should therefore be set with caution: Each testpointoccupies some tens bytes of the card memory
复制工程后编译method不能调用:要修改隐藏文件.project,位置:device目录下
Error happening in creating TestMethod “” :std:bad_alloc——未解决,不知道发生异常点在哪
ARPM-Can't active set 201001 for DCS pin 上电状态下,切换了V/I range
Prober Drives——configuration parameters (1)prober_site_ids The order and naming of the site IDs should match the equipment documentation to avoidconfusion. The left most entry refers to the first equipment site, the right most entry refers tothe last equipment site. (2)prober_site_mask This mask tells the driver which of the equipment sites are active (=1) and which are(currently) deactivated (=0). (3)smartest_site_to_prober_site_map(与pin configuration对应,顺序决定site递增递减方向) Maps the SmarTest sites to the equipment sites. The mapping corresponds to handler_site_ids, or prober_site_ids,respectively. (4)multi_site_die_offsets(与(3)同方向则同向递增,逆方向则反向递减,举例) This parameter defines a list of X/Y pairs. Each pair represents the relative die position of asite with respect to the primary die (the relative position of the primary die to itself is 0,0).The list starts with site 1, then site 2, and so on. The direction of X and Y axis is as definedin the wafermap. 举例:
ARRAY_I定义:run()中直接给定大小有限制,不规则,大概是300000-499999之间。两个解决办法:①用resize限制大小②将定义放到run()前面pattern修改后不能保存:RDI_configure文件中,参数SETUP_UPTODATE赋值修改为false。解释如下:Specify this option to TRUE to have NO * (asterisk) in the setuptool; or to FALSE to have * in the setuptool..