Abbreviated terms | Terms | 中文直译 |
---|---|---|
ACC | Adaptive Cruise Control | 自适应巡航控制 |
ADC | Analogue to Digital Converter | 模拟数字转换器 |
AEC | Automotive Electronics Council | 汽车电子委员会 |
AIS | Abbreviated Injury Scale | 简化的伤害定级 |
ALU | Arithmetic Logic Unit | 算术逻辑单元 |
ASIC | Application-Specific Integrated Circuit | 专用集成电路 |
ASIL | Automotive Safety Integrity Level | 汽车安全完整性等级 |
BB | Body Builder | 车身制造厂 |
BFR | Base Failure Rate | 基本故障率 |
BIST | Built-In Self-Test | 内置自检 |
CAN | Controller Area Network | 控制器局域网 |
CCF | Common Cause Failure | 共因故障 |
CCP | Controllability Classification Panel | 可控性分类面板 |
CMOS | Complementary Metal Oxide Semiconductor | 互补金属氧化物半导体 |
COTS | Commercial Off The Shelf | 商业现货 |
CPU | Central Processing Unit | 中央处理器 |
CRC | Cyclic Redundancy Check | 循环冗余校验 |
DC | Diagnostic Coverage | 诊断覆盖度 |
DAC | Digital to Analogue Converter | 数模转换器 |
DFA | Dependent Failure Analysis | 相关性失效分析 |
DFI | Dependent Failure Initiator | 相关故障发起者 |
DIA | Development Interface Agreement | 开发接口协议 |
DMA | Direct Memory Access | 直接内存访问 |
DMOS | Double diffused Metal Oxide Semiconductor (HV MOS) | 双扩散金属氧化物半导体 |
DSP | Digital Signal Processor | 数字信号处理器 |
ECC | Error Correction Code | 错误纠正码 |
ECU | Electronic Control Unit | 电子控制单元 |
EDC | Error Detection Code | 错误检测代码 |
E/E system | Electrical and/or Electronic system | 电气电子系统 |
EEC | Evaluation of Each Cause of safety goal violation | 评估违反安全目标原因 |
EMC | ElectroMagnetic Compatibility | 电磁兼容 |
EMI | ElectroMagnetic Interference | 电磁干扰 |
EOTI | Emergency Operation Time Interval | 紧急操作时间间隔 |
EOTTI | Emergency Operation Tolerance Time Interval | 紧急操作容许时间间隔 |
ESD | ElectroStatic Discharge | 静电放电 |
ESC | Electronic Stability Control | 电子稳定控制 |
ETA | Event Tree Analysis | 事件树分析 |
EVR | Embedded Voltage Regulator | 嵌入式稳压器 |
FDTI | Fault Detection Time Interval | 嵌入式稳压器 |
FET | Field Effect Transistor | 场效应晶体管 |
FHTI | Fault Handling Time Interval | 故障处理时间间隔 |
FIT | Failures In Time (in this standard a FIT is 10E-9 failures per operational hour) | 失效率 |
FMC | Failure Mode Coverage | 故障模式覆盖度 |
FMEA | Failure Mode and Effects Analysis | 失效模式及影响分析 |
FPGA | Field Programmable Gate Array | 现场可编程门阵列 |
FRTI | Fault Reaction Time Interval | 故障反应时间间隔 |
FTA | Fault Tree Analysis | 故障树分析 |
FTTI | Fault Tolerant Time Interval | 容错时间间隔 |
GPU | Graphics Processing Unit | 图形处理单元 |
HARA | Hazard Analysis and Risk Assessment | 危害分析和风险评估 |
HAZOP | HAZard and OPerability analysis | 危害与可操作性分析 |
HSI | Hardware-Software Interface | 硬件-软件接口 |
HS/LS | High Side / Low Side | 高边/低边 |
HW | HardWare | 硬件 |
IC | Integrated Circuit | 集成电路 |
I/O | Input – Output | 输入/输出 |
ISA | Instruction Set Architecture | 指令集架构 |
LDO | Low Drop Output regulator | 低压降输出稳压器 |
LFM | Latent-Fault Metric | 潜伏故障度量 |
LS | Low Side | 低边 |
LSB | Least Significant Bit | 最低有效位 |
MBD | Model Based Development | 基于模型的开发 |
MC/DC | Modified Condition/Decision Coverage | 修改条件/决策覆盖 |
MCU | Multi-point Control Unit | 多点控制器 |
MMU | Memory Management Unit | 内存管理单元 |
MPU | Memory Protection Unit | 内存保护单元 |
MSIL | Motorcycle Safety Integrity Level | 摩托车安全完整性等级 |
MUX | MUltipleXer | 数据选择器 |
OEM | Original Equipment Manufacturer | 原始设备制造商 |
OS | Operating System | 操作系统 |
OV | Over Voltage | 过压 |
PAL | Programmable Array Logic | 可编程阵列逻辑 |
PE | Processing Element | 处理元件 |
PLD | Programmable Logic Device | 可编程逻辑器件 |
PLL | Phase Locked Loop | 锁相环 |
PMHF | Probabilistic Metric for random Hardware Failures | 随机硬件故障的概率度量 |
PoF | Physics of Failure | 物理失效 |
PPAP | Production Part Approval Process | 生产件审批流程 |
PTO | Power Take-Off | 动力输出装置 |
QM | Quality Management | 质量管理 |
RAM | Random Access Memory | 随机内存访问 |
RF | Residual Fault | 残余故障 |
RFQ | Request For Quotation | 询价 |
ROM | Read Only Memory | 只读存储器 |
RTL | Register Transfer Level | 寄存器转换级 |
SEB | Single Event Burnout | 单粒子烧毁 |
SEE | Single Event Effect | 单粒子效应 |
SEGR | Single Event Gate Rupture | 单粒子栅穿 |
SEooC | Safety Element out of Context | 脱离上下文的安全元素 |
SET | Single Event Transient | 单粒子瞬态 |
SEU | Single Event Upset | 单粒子翻转 |
SG | Safety Goal | 安全目标 |
SMPS | Switched Mode Power Supply | 开关电源 |
SoC | System on Chip | 片上系统 |
SOP | Start Of Production | 开始量产 |
SPFM | Single-Point Fault Metric | 单点故障度量 |
SPI | Serial Peripheral Interface | 串行外设接口 |
SW | SoftWare | 软件 |
T&B | Trucks, Buses, trailers and semi-trailers | 卡车,公共汽车,拖车和半拖车 |
TCL | Tool Confidence Level | 工具置信度 |
TD | Tool error Detection | 工具错误检测 |
TI | Tool Impact | 工具影响 |
UML | Unified Modeling Language | 统一建模语言 |
UV | Under Voltage | 欠压 |
XML | eXtensible Markup Language | 可扩展标记语言 |
ISO 26262-1:2018缩略词
于 2022-10-23 15:27:50 首次发布