该文详细介绍了NAND存储设备的SMART日志，包括错误信息、固件插槽信息和健康状态等。SMARTInfo中包含了温度、可用空间、坏块比例等关键指标，以及控制器状态的严重警告，如温度超标、可用备用空间下降等。此外，文章还提及了各种错误计数，如编程失败、擦除失败和媒体错误，用于评估设备的可靠性和耐久性。
| Log Id |
Log Page Name |
Location |
Description |
| 00h |
supported Log |
NAND |
GLP支持的列表 |
| 01h |
Error Info |
DDR |
发生error的命令相关信息 |
| 02h |
SMART Info |
NAND |
Smart log |
| 03h |
FW Slot Info |
NAND |
FW slot log |
| 04h |
Change NS |
NAND |
NS变更log |
| CAh |
Additional SMART Info |
NAND |
additional smart log |
其他还有很多vendor命令就不列了。
SMART Info:
typedef struct {
union {
struct {
UCHAR AvailableSpaceLow : 1;
UCHAR TemperatureThreshold : 1;
UCHAR ReliabilityDegraded : 1;
UCHAR ReadOnly : 1;
UCHAR VolatileMemoryBackupDeviceFailed : 1;
UCHAR Reserved : 3;
} DUMMYSTRUCTNAME;
UCHAR AsUchar;
} CriticalWarning;
UCHAR Temperature[2];
UCHAR AvailableSpare;
UCHAR AvailableSpareThreshold;
UCHAR PercentageUsed;
UCHAR Reserved0[26];
UCHAR DataUnitRead[16];
UCHAR DataUnitWritten[16];
UCHAR HostReadCommands[16];
UCHAR HostWrittenCommands[16];
UCHAR ControllerBusyTime[16];
UCHAR PowerCycle[16];
UCHAR PowerOnHours[16];
UCHAR UnsafeShutdowns[16];
UCHAR MediaErrors[16];
UCHAR ErrorInfoLogEntryCount[16];
ULONG WarningCompositeTemperatureTime;
ULONG CriticalCompositeTemperatureTime;
USHORT TemperatureSensor1;
USHORT TemperatureSensor2;
USHORT TemperatureSensor3;
USHORT TemperatureSensor4;
USHORT TemperatureSensor5;
USHORT TemperatureSensor6;
USHORT TemperatureSensor7;
USHORT TemperatureSensor8;
UCHAR Reserved1[296];
} NVME_HEALTH_INFO_LOG, *PNVME_HEALTH_INFO_LOG;
| SMART log | |
| critical_warning : 4 | |
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