EBSD point-to-point Misorientation Distribution 3D representation
'misorientation_distribution.m' allows, using EBSD data, an indirect statistical measurement of the Effective Grain Size, concept developed by Abhijit Brahme et al.[1]; that is, the distance between non-adjacent pixels above which their disorientation (also called misorientation) gets random. The average disorientation becomes stabilized at that distance, as one of the graphics shows.
This m-file also plots the misorientation distributions as a function of the distance between EBSD pixels, in both 3D and 2D.
'misorientation_distribution.m' has been optimized in both memory and time, so that it can be executed in a standard computer in a few minutes. For further information and support about running the program, solving memory issues or interpreting results, do not hesitate to contact the author: lucia.morales@cenim.csic.es
[1]‘Determination of the Minimum Scan Size to Obtain Representative Textures by Electron Backscatter Diffraction’. ABHIJIT BRAHME, YAUHENI STARASELSKI, KAAN INAL, and RAJA K. MISHRA. The Minerals, Metals & Materials Society and ASM International 2012.