(www.homeworkhelp.cc整理编辑)How the change at XYZsoft‘s testing policy contributes to increase in the n

How the change at XYZsoft’s testing policy contributes to increase in the number of complaints regarding ABCtronics’ IC chips? Comment on the issue of SHVP. Do you think that ABCtronics is over-estimating the output of IC chips? 2. Why Phil could sense that the new policy did not have much impact compared to the previous one ? 3. Recheck? So what kind of probability distribution we have now? 4. Hypothesis testing? Ho: H2?Z = * 5. Conclusion of the hypothesis testing? Resources: “The number of complaints from XYZsoft increased because a few months ago, XYZsoft started a module-wise testing of their product. Circuit module M (CM) has a path where three chips from ABCtronics get connected in a series. Before the new testing process, XYZsoft reported that in a typical lot comprising 20 CMs they are finding three defective items. they observed that the problem was with our chips. They have now started to calculate the number of non-defectives before they encounter a particular number of defectives, and they started the count of 3. Till this point of time nothing happened.” Phil could sense that the new policy did not have much impact compared to the previous one. He pondered in his mind, how would that be possible? “The problem began as their testing team proposed that they should send back the whole lot for rework and recheck as soon as one defective item is found. All hell has broken loose since then. We are now flflooded with requests for rechecks from 1 XYZsoft.” At this point, Mark commented, “I am telling you, Jim, we can easily tackle this problem if we implement ICTM at our end.” Jim looked at Mark but said nothing. The entire episode puzzled him. How can a change in the quality control policy of XYZsoft have serious implications on the business of ABCtronics? Jim replied, “We need to tackle this problem quickly. XYZsoft is our biggest client. We simply cannot afford to lose their business.”
Robert continued, “I had a talk with Stuart regarding this matter. He told me that [the] Susceptible High Voltage Problem (SHVP)4 could contribute to this kind of issue. His team is looking into this aspect on the priority basis." After hearing this, Jim looked at Stuart and said, “I thought we dealt with this problem a couple of years ago.” Stuart replied, "We are checking to be sure of the fact that it is not due to SHVP. Tests would be complete within next week.” Jim replied, “Do you have any preliminary report on this test?” Stuart said, "As per historical data, our IC chips produce [a] minimum 2.7 V output on an average, as HIGH signal. The variance of the HIGH signal out put voltage remains 1.8 V. We have received a number of complaints from XYZsoft that the IC chips are not producing the expected voltage. Then, I ordered to take a random sample of 100 IC chips across the lots and test them for SHVP. Initial reports suggest the average voltage produced by the IC chips is around 2.3 V.” At this point, Mark commented, “Is it possible that we are overestimating the output of the IC chips?” Stuart replied, “It may be the case. We would not know for sure unless the detailed report comes.” Phil could sense that the entire XYZsoft episode had caused a fluttering feeling across the power corridor of ABCtronics. They need a fast fix for the problem and as of now none was in sight. A stifled silence prevailed over the board room.(由留学作业帮www.homeworkhelp.cc整理编辑)

2.
Before testing the new process, the XYZsoft reports that in a lot of 20 CM’s three are found to be defective.
Now they started to calculate the total number of non-defectives before they get a defective item and the count started at 3 which indicates that in certain lots, the number of non-defective items is 3. Therefore Pill could sense that newvpolicy did not have much impact over the previous one.

The probability distribution e have now is Binomial probability distribution.
In Probability theory, the binomial distribution is a discrete probability distribution of the number of successes in n independent trials with two parameter such as n and p where n denotes the number of trials and p denotes the probability of success.
The PMF of the distribution is given by:
n f(x) = (2)4** = pq 9 , x € 0,1, …, n}, n € {0, 1, …} .p € 0,1],q=1-p
According to the Problem,
Let X be the random variable denoting the number of defectives in a lot.
Let p be the probability of number of defectives in a lot
3 P= 20 = = 0.15
q=1-0.15 = 0.85
This is a binomial probability distribution, as there are two outcomes: either a CM is defective or a CM is non-defective and each event is independent.

Assumptions of one sample z-test:

The data are continuous not discrete.
The data follow the normal probability distribution.
The sample is a simple random sample from the population. Each individual in the population has an equal probability of being selected in the sample.
The population standard deviation should be known.
One sample t-test procedure:
To test:
The Null hypothesis Ho:μ = μον = (Hypothesized value) AGAINST The Alternative Hypothesis H_1:\mu < \mu 0 (Hypothesized value)
Test Statistic:
The test statistic is the value used to produce the P-Value based on the norma; distribution. The test statistic is given as follows:
u = 2 011 n
where
\mu is the average of the data values
011 is the hypothesized value.
\sigma is the standard deviation of the data values
n is the sample size.
P-Value:
The probability level also known as the P-Value is the probability that the test statistic will take a value at least as extreme as the observed value assuming that the null hypothesis is true.
Test Rule:
We reject the null hypothesis in favor of the alternative hypothesis if 0-T2 >> 2
According to the Problem,
To Test:
Но The mean voltage as HIGH signal produced by the IC chips is equal to 2.7V. Against H_1:The mean voltage as HIGH signal produced by the IC chips is less than 2.7V.
In other words,
H_0:\mu =2.7 against H_1:\mu <2.7
It is given that a sample of n = 100 IC chips across the lot is collected.
It is given that the sample mean is 2.3V and the population standard deviation is 1.8V.
The value of the test statistic is calculated as :
z=\frac{2.3-2.7}{\frac{1.8}{\sqrt{100}}}
= -0.4 1.8 10
-0.4 0.18
= -2.2222
The value of the test statistic is obtained as -2.2222.
Here we will consider the standard significance level as \alpha =0.05
The critical value of z associated with the degrees of freedom is obtained as:
z{1-0.05}=-1.64485
The P-value of the test is obtained as:P-value= 0.0131349
We have obtained the values using R-Software:
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CONCLUSION:

Since z=-2.2222<z_{1-0.05}=-1.644854 , we reject the null hypothesis in favour of the alternative hypothesis and conclude on the basis of the given data that the mean voltage as HIGH signal produced by the IC chips is less than 2.7V.
The P-Value obtained for the above test is obtained as P-value=0.0131349 which is less than the significance level \alpha =0.05. A low P-value is statistically significant. There is strong evidence that we reject the null hypothesis as there is only 5% probability that the null is correct. Therefore, we reject the null hypothesis and accept the alternative hypothesis. Thus we conclude on the basis of the given data that the mean voltage as HIGH signal produced by the IC chips is less than 2.7V.
Thus, we have enough evidence to conclude that the average voltage as HIGH signal produced by the IC chips is less than 2.7V, at 5% significance level. Therefore it is possible that they are overestimating the output of the IC chips.