Linux系统下如何查看硬盘剩余使用寿命？

1、使用smartclt命令查看硬盘的smart信息，如以下范例：

smartctl -a /dev/sdb

smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.14.0-49.15.x86_64] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model:     SAMSUNG MZ7LH480HAHQ-00005 Serial Number:     S45PNA0M540908 LU WWN Device Id:    5 002538 e001d842c Firmware Version:    HXT7404Q User Capacity:      480,103,981,056 bytes [480 GB] Sector Sizes:      512 bytes logical, 4096 bytes physical Rotation Rate:      Solid State Device Form Factor:      2.5 inches Device is:        Not in smartctl database [for details use: -P showall] ATA Version is:     Unknown(0x0ffc), ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is:    SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is:      Tue Oct 19 16:03:51 2021 CST SMART support is:    Available - device has SMART capability. SMART support is:    Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: ATA return descriptor not supported by controller firmware SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status:  (0x00)Offline data collection activity                was never started.                Auto Offline Data Collection: Disabled. Self-test execution status:      (   0)The previous self-test routine completed                  without error or no self-test has ever              been run. Total time to complete Offline data collection:            (    0) seconds. Offline data collection capabilities:             (0x53) SMART execute Offline immediate.                          Auto Offline data collection on/off support.                    Suspend Offline collection upon new                    command.                    No Offline surface scan supported.                    Self-test supported.                    No Conveyance Self-test supported.                    Selective Self-test supported. SMART capabilities:            (0x0003)Saves SMART data before entering                    power-saving mode.                    Supports SMART auto save timer. Error logging capability:           (0x01)Error logging supported.                    General Purpose Logging supported. Short self-test routine recommended polling time:    (   2) minutes. Extended self-test routine recommended polling time:    (  35) minutes. SCT capabilities:         (0x003d)  SCT Status supported.               SCT Error Recovery Control supported.               SCT Feature Control supported.               SCT Data Table supported.   SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged.  [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1  SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS    1     0      0   Not_testing    2     0     0   Not_testing    3     0     0   Not_testing    4    0      0   Not_testing    5     0      0   Not_testing Selective self-test flags (0x0):   After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.

smartctl -a /dev/sdc

smartctl 6.5 2016-05-07 r4318 [x86_64-linux-4.14.0-49.15.x86_64] (local build) Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model:     SAMSUNG MZ7LH480HAHQ-00005 Serial Number:     S45PNA2MC20956 LU WWN Device Id:   5 002538 e19c1c198 Firmware Version:   HXT7404Q User Capacity:     480,103,981,056 bytes [480 GB] Sector Sizes:     512 bytes logical, 4096 bytes physical Rotation Rate:     Solid State Device Form Factor:      2.5 inches Device is:        Not in smartctl database [for details use: -P showall] ATA Version is:     Unknown(0x0ffc), ACS-4 T13/BSR INCITS 529 revision 5 SATA Version is:    SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s) Local Time is:     Tue Oct 19 16:03:51 2021 CST SMART support is:   Available - device has SMART capability. SMART support is:   Enabled === START OF READ SMART DATA SECTION === SMART Status not supported: ATA return descriptor not supported by controller firmware SMART overall-health self-assessment test result: PASSED Warning: This result is based on an Attribute check. General SMART Values: Offline data collection status:  (0x00)Offline data collection activity                was never started.                Auto Offline Data Collection: Disabled. Self-test execution status:      (   0)The previous self-test routine completed                without error or no self-test has ever                been run. Total time to complete Offline data collection:            (    0) seconds. Offline data collection capabilities:                 (0x53) SMART execute Offline immediate.                   Auto Offline data collection on/off support.                   Suspend Offline collection upon new                   command.                   No Offline surface scan supported.                   Self-test supported.                   No Conveyance Self-test supported.                   Selective Self-test supported. SMART capabilities:            (0x0003)Saves SMART data before entering                   power-saving mode.                   Supports SMART auto save timer. Error logging capability:        (0x01)Error logging supported.                   General Purpose Logging supported. Short self-test routine recommended polling time:    (   2) minutes. Extended self-test routine recommended polling time:    (  35) minutes. SCT capabilities:         (0x003d)  SCT Status supported.                 SCT Error Recovery Control supported.                 SCT Feature Control supported.                 SCT Data Table supported.   SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged.  [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1  SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS   1     0      0    Not_testing   2     0      0    Not_testing   3     0      0    Not_testing   4     0      0    Not_testing   5     0      0    Not_testing Selective self-test flags (0x0):   After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.

2、三星的硬盘根据smart信息中的177项判断硬盘的剩余寿命，如以下信息：

（1）序列号为：S45PNA0M540908的sdb硬盘，177项的VALUE和WORST都是86，说明硬盘的寿命剩余86％。

Vendor Specific SMART Attributes with Thresholds:

（2）序列号为：S45PNA2MC20956的sdc硬盘，177项的VALUE和WORST都是92，说明硬盘的寿命剩余92％。

Vendor Specific SMART Attributes with Thresholds: