作品集
论文:Impact of Back-Gate Radiation on Single-Event Effects of Ultrathin Body and Buried Oxide Fully Depleted Silicon-on-Insulator MOSFETs
链接:https://link.springer.com/article/10.1007/s11664-023-10680-8
专利1:一种针对集成电路NBTI失效的SPICE电路仿真方法
链接:https://pss-system.cponline.cnipa.gov.cn/documents/detail?prevPageTit=changgui
专利2:一种集成电路耦合失效SPICE仿真方法
链接:https://pss-system.cponline.cnipa.gov.cn/documents/detail?prevPageTit=changgui