单片机c语言多波形发生,[工学]基于C语言的单片机波形发生器.doc

[工学]基于C语言的单片机波形发生器

摘 要

系统是由单片机控制的波形发生器。波形发生器作为一种测试设备正在大规模、超大规模集成电路芯片测试和数字系统设计中获得广泛的应用。本设计的系统可以实现标准波形的发生功能、包括、频率功能设定。为了充分实现这些功能，还扩展了键盘，用。本系统对于波形的幅值和频率的调整主要由软件实现，首先，读入用户根据自己的需要由键盘所输入的数据，由软件实现波形的变化，由DAC083实现D/A转换。关键字：单片机，波形发生器，??

ABSTRACT

The system is the wave generator which controls by the monolithic integrated circuit. The wave generator took one kind of test facility large-scale, the ultra large scale integrated circuit chip test and in the digital system design obtains the widespread application. This design system may realize the standard wave pattern occurrence function, including the peak-to-peak value, the frequency function hypothesis. In order to fully realizes these functions, and expanded the keyboard entry function, uses in to adjust the output signal.

This system mainly realizes regarding the wave peak-to-peak value and the frequency adjustment by software, First uses MAX038 to build a profile to have the electric circuit, Then controls this wave with the monolithic integrated circuit, also the read-in user according to own need the data which inputs by the keyboard, by the software realization wave change, realizes the D/A transformation by DAC0832. This generator output has the sine wave, the triangle wave, the square-wave three kind of waveform, the output signal frequency in the scope is in the 1Hz~1KHz scope, greatest peak-to-peak value 3V carries on the adjustment through the program control method, the output is stable, the degree of distortion is very small.

Key words: mcu wave generator max038

目录

摘 要I

ABSTRACTII

第1章 绪论1

1.1 课题背景及重要意义1

1.1.1 课题的背景1

1.1.2 课题的意义2

1.2 课题设计的目的及目标3

第2章 器件和使用原理4

2.1 MAX038简介和使用说明4

2.2 DAC0832简介和使用说明6

2．3 AT89C51单片机简介8

第3章 系统硬件设计11

3.1 单片机与按键电路设计11

3.2 MAX038外围电路设计12

3.3 DAC0832外围电路设计14

第4章 系统软件设计16

4.1 软件设计概述16

4.2 波形的选择17

4.3按键模块18

4.3.1按键的识别18

4.3.2按键消抖问题18

4．4单片机控制DAC0832模块19

第五章总结21

致谢22

参考文献23

附录A24

附录B25

第1章 绪论

1.1 课题背景及重要意义

1.1.1 课题的背景

在电子测量仪器家族中，信号发生器即波形发生器是一种很重要的仪器，它是电子测试系统的重要部件，是决定电子测试系统性能的关