Logic BIST

Logic BIST is crucial for many applications, in particular for life-critical and mission-critical applications.

Logic BIST不需要在ATE上进行测试，减小了成本，但是电路本身是可能存在问题的，导致测试逻辑有问题而且增加了逻辑。

Basic concepts and design rules of logic BIST

Test pattern generation(exhaustive testing/pseudo-random testing/pseudo-exhaustive testing),

output response analysis(ones count testing/transition count testing/signature analysis)

logic bist architecture STUMPS

For stuck-at faults and bridging faults,how to test faults in a scan-based design containing multiple clock domain

For path-delay and transition delay, how to test

 

Design a logic bist system：test pattern generator, output response analyzer, logic BIST controller

Traditional test techniques that use ATPG software to target single faults for digital circuit testing have become quite expensive

And can no longer provide sufficiently high fault coverage.

Two general categories of bist techniques：

1)       online BIST, is performed when functional circuitry is in normal operational mode

concurrently：test is conducted during normal functional operation, generate interrupt for failures.

nonconcurrently：test is perfo