IC EMC(集成电路电磁兼容)测试标准介绍

IEC标准委员会的国际标准类型汇总

IEC 61967 Integrated circuits–Measurement of electromagnetic emissions, 150 kHz to 1 GHz（电磁发射标准系列）

Part 1:General conditions and definitions

Part 2:Measurement of radiated emissions –TEM cell and wideband TEM cell method

Part 3-TS:Measurement of radiated emissions –Surface scan method

Part 4:Measurement of conducted emissions –1 Ω/150 Ω direct coupling method

Part 4-1-TR:Application guidance to IEC 61967-4

Part 5:Measurement of conducted emissions –Workbench Faraday Cage method

Part 6: Measurement of conducted emissions –Magnetic probe method

Part 8: Measurement of radiated emissions - IC stripline method

IEC 62132 Integrated circuits–Measurement of electromagnetic immunity, 150 kHz to 1 GHz （电磁抗扰度标准系列）

Part 1:General conditions and definitions

Part 2: Measurement of Radiated Immunity - TEM Cell and Wideband

TEM Cell Method

Part 3: Bulk current injection (BCI) method

Part 4:Direct RF power injection method

Part 5:Workbench Faraday cage method

Part 8: Measurement of radiated immunity - IC stripline method

Part 9-TS: Measurement of radiated immunity - Surface scan method

IEC 62215 Integrated circuits–Measurement of impulse immunity（脉冲抗扰度标准-EFT和surge）

Part 3: Non-synchronous transient injection method

Part 2: synchronous transient injection method

后记：目前国内已经引进了部分标准作为国标，国内的IC厂商还没有将IC EMC测试纳入到芯片开发的流程环节中去，随着国内IC产业的发展，相信这个方向会在业内得到越来越高的重视！