JESD22-A103E.01：2021 High Temperature Storage Life， 高温贮存寿命规范标准 ， 最新版2021年刚刚发行

JESD22-A103E.01：2021 High Temperature Storage Life 高温贮存寿命 最新版

JESD22-A103E.01：2021HighTemperatureStorageLife高温贮存寿命最新.pdf-其它文档类资源-CSDN下载JESD22-A103E.01：2021HighTemperatureStorageLife更多下载资源、学习资料请访问CSDN下载频道.https://download.csdn.net/download/std86021/85028413范围
本试验适用于所有固态设备的评估、筛选、监测和/或鉴定。
高温存储测试通常用于确定存储条件下的时间和温度对固态电子设备（包括非易失性存储器设备（数据保持失效机制））的热激活失效机制和失效时间分布的影响。热激活失效机制采用阿累尼乌斯加速度方程建模。在试验过程中，在不施加电气条件的情况下使用加速应力温度。该测试可能具有破坏性，具体取决于时间、温度和包装（如有）。

Scope
The test is applicable for evaluation, screening, monitoring, and/or qualification of all solid state
devices.
The high temperature storage test is typically used to determine the effects of time and
temperature, under storage conditions, for thermally activated failure mechanisms and time-tofailure
distributions of solid state electronic devices, including nonvolatile memory devices (data
retention failure mechanisms). Thermally activated failure mechanisms are modeled using the
Arrhenius Equation for acceleration. During the test, accelerated stress temperatures are used
without electrical conditions applied. This test may be destructive, depending on time,
temperature and packaging (if any)