关于芯片测试有相当多的简称和缩写,而测试这一行的相关资料又相对较少,入门门槛比较高,这里列出一些测试方面的缩写,方便有需要的人查询。表格以首字母排序。
缩写 | 全称 | 含义 | 缩写 | 全称 | 含义 |
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ATE | Automatic(Automated) Test Equipment | 自动化测试设备 | ATPG | Automatic Test Pattern Generation | 测试图形自动生成器 |
AWG | Arbitrary Waveform Generator | 任意波形发生器 | BIST | Built-In Self Test | 芯片内建测试 |
CIS | Communication | 通信接口规格 | CMRR | Common-Mode Rejection Ratio | 共模抑制比 |
COT | Cost of Test | 测试成本 | CUT | Circuit Under Test | 被测电路 |
DBM | Data Buffer Memory | 数据缓冲存储器 | DFT | Design For Test | 可测性设计 |
DFT | Discrete Fourier Transform | 离散傅里叶变换 | DIB | Device Interface Board | 器件接口板 |
DLE | Differential Linearity Error | 微分线性误差 | DNL | Differential Nonlinearity | 微分非线性 |
DOT | Defect Oriented Testing | 面向缺陷测试 | DR | Dynamic Range | 动态范围 |
DUT | Device Under Test | 被测器件 | DVM | Digital Voltmeter | 数字电压表 |
ECR | Error Catch Ram | 错误数据存储器 | ENOB | Equivalent Number of Bits | 有效数字位数 |
ESD | Electrostatic Discharge | 静电放电 | FFT | Fast Fourier Transform | 快速傅里叶变换 |
FMEA | Potential Failure Mode and Effects Analysis | 潜在失效模式与后果分析 | FSR | Full Scale Range | 满量程 |
GRR | Gage(Gauge) Repeatability and Reproducibility | 仪器的重复性与再现性 | ILE | Integral Linearity Error | 积分线性误差 |
INL | Integral Nonlinearity | 积分非线性 | LEB | Leading Edge Blanking | 前沿消隐 |
LNA | Low-Noise Amplifier | 低噪声放大器 | LSB | Least Significant Bit | 最低有效位 |
LSL | Lower Specification Limit | 规格下限 | LVM | Logic Vector Memory | 逻辑矢量存储器 |
MSA | Measurement Systems Analysis | 测试系统分析 | MSB | Most Significant Bit | 最高有效位 |
MSE | Multi-Site Efficiency | 多Site并行测试 | NEB | Noise Equivalent Bandwidth | 噪声等效带宽 |
NF | Noise Figure | 噪声系数 | PDF | Probability Density Function | 概率密度函数 |
PGA | Programmable Gain Amplifier | 可编程增益放大器 | PIB | Probe Interface Board | 探针接口板 |
PLL | Phase Locked Loop | 锁相环 | POR | Power On Reset | 上电复位 |
PSD | Power Spectral Density | 功率谱密度 | PSRR | Power Supply Rejection Ration | 电源纹波抑制比 |
PWM | Pulse Width Modulation | 脉宽调制 | RMS | Root Mean Square | 均方根 |
RR | Ripple Rejection Ratio | 纹波抑制比 | SA | Spectrum Analyzer | 频谱分析 |
SCR | Silicon-Controlled Rectifier | 可控硅 | SNDR | Signal-to-Noise Plus Distortion Ratio | 信噪失真比 |
SNR | Signal to Noise Ratio | 信噪比 | SPC | Statistical Process Control | 统计制程控制 |
THD | Total Harmonic Distortion | 总谐波失真 | TP | Test Program | 测试程序 |
UPH | Units Tested Per Hour | 每小时测试器件数 | USL | Upper Specification Limit | 规格上限 |
VCO | Voltage Controlled Oscillator | 压控震荡器 | VNA | Vector-Network Analyzer | 矢量网络分析仪 |
OTA | Overall Timing Accuracy | 整体定时精度 | EPA | Edge Placement Accuracy | 时沿精度 |