20年磨一剑,数慧时空推出智能遥感云平台DIEY及自然资源多模态大模型“长城”

第十二届全球地理信息开发者大会在京举行,聚焦时空智能技术与应用创新。李德仁院士探讨元宇宙与ChatGPT影响,数慧时空发布自然资源多模态大模型“长城”及智能遥感云平台DIEY,旨在通过AI和GPT技术优化行业效率。DIEY产品提供实时影像处理和服务交付,已形成多项专利并达成与长光卫星的战略合作。

5月17日,主题为“时空智能 从感知到决策”的第十二届全球地理信息开发者大会(WGDC2023)在北京昆泰酒店举行。大会聚集了千余位产业专家、行业用户、创新企业等业界精英,共话时空智能时代下的技术发展与应用创新。中国科学院院士、中国工程院院士李德仁,自然资源部中国地质调查局原副局长李朋德,国防科工局遥感卫星应用总工程师赵文波,中国测绘学会副理事长兼秘书长彭震中,中国地理学会副会长兼秘书长张国友,中国遥感应用协会秘书长卫征专家出席了开幕式。

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WGDC2023会议现场

本次大会,中国科学院院士、中国工程院院士李德仁首发《我看元宇宙与ChatGPT——剖析数字孪生与数字原生》,指出要充分应用GPT、数字孪生、云计算、区块链等信息技术,实现政府管理、经济发展、民众生活模式转变。

在新品发布环节,数慧时空重磅发布了自然资源多模态大模型——长城,以及基于该大模型自主研发的智能遥感云平台DIEY产品。数慧时空副总经理卢宇航在发布会上首先指出,在后疫情时代,为了实现业务的复苏与增长,企业迫切地希望承揽更多的项目,这势必要计划招更多的人、买专业的工具、设计更优的生产工艺。但不管怎么计划,企业会发现制约发展的始终是成本。行业的从业单位和从业人数一直在壮大,但人均产值和企业剩余利润却在逐年降低,行业已经到了必须优化升级的生死关口,而AI和GPT给我们带来了重生的机遇。

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数慧时空副总经理卢宇航

“长城”大模型是基于数慧时空在自然资源领域20年的业务理解和技术积累,自主研发的一款自然资源行业大模型。它综合了自然资源领域文本、图像、视频等多种模态的数据,通过对不同模态数据的学习,能够有效对自然资源调查、审批、监管等业务进行理解和生成。“长城”大模型可用于要素解译、变化监测、反演等处理能力的增强。

DIEY是数慧时空历时3年研发的智能遥感云平台,它融合了AI、计算机视觉、知识图谱等技术,在“长城”大模型的助力下,以“卫星即服务”为愿景,打造了无人值守的影像处理工厂、要素提取工厂、应用构建工厂,可实现从遥感影像获取到最终服务交付的实时化、无缝化,让卫星成为人人可用的大数据。

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DIEY产品矩阵

在产品发布环节,卢宇航以青岛的正射影像生产、基础要素提取、耕地非农应用构建为例,展示了DIEY在质检、统筹、纠正、镶嵌等方面的影像处理技术,在要素解译、样本精化、变化监测、后处理等方面的要素提取技术,在应用编排、在线调试、服务发布等方面的应用构建技术。

目前,DIEY产品通过不断迭代,已形成60余项专利,累计服务国内外20余个区域。

会上,数慧时空宣布与长光卫星正式签订战略合作框架协议。双方将秉承“科技引领,创新合作”机制,在卫星数据加工处理、卫星行业应用、科技创新、人才培养等方面积极开展交流合作,并将共同推出“卫星即服务”系列监测产品,实现重点对象即时监测、重点区域每日监测、重点城市每周监测、重点省份每月监测。

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数慧时空与长光卫星正式签订战略合作框架协议

最后,卢宇航总结道,DIEY支持企业以“前店后厂”的商业模式开展业务。如果你是上游企业更贴近数据,你可以建厂,由DIEY为你提供生产车间,你也可以委托数慧时空给你做加工;如果你是下游企业更贴近用户,你可以开店,基于DIEY向用户提供专题产品、应用开发等增值服务;如果你是集成商,你可以在你擅长的领域,同时建厂开店。DIEY在数慧时空和长光卫星的共同赋能下,相信一定会为行业带来增量,从而为企业“省钱、生钱”。

在本次大会上,数慧时空还入选“年度最具创新力企业TOP100”,智能遥感云平台DIEY产品入选“年度最具创新力产品TOP30”。

 

DEVICE.SUMMARY.TAB_FILTER with tlist as( select nvl(c.device_name,a.cell_name) as item, b.vt_type || ' ' || nvl(c.para,a.test_item) as parameterStr from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA a join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname and b.delete_status = 0 left join IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG c on a.item = c.item and a.cell_name = c.cellname and a.test_item = c.test_item left join YES_USER.T_WAP_TARGET_INFO d on b.item = d.item and a.cell_name = d.cellname and d.delete_status = 0 and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE and a.test_item = d.CONFIG_KEY and d.config_type = 'targetConfig' where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1 ? ? ? ? ? ? ? ? ? ? ? ? ? ) SELECT distinct item,parameterStr from tlist where 1=1 ? DEVICE.SUMMARY.SPLIT_TAB_FILTER select loopName,stepName from( select loop_name as loopName, step_name as stepName from TDWB_T_PLM_DEVICE_SPLIT_TAB_CONFIG where 1=1 ? ? group by loop_name,step_name ) limit 100 DEVICE.DOE.SELECT_DATA_LIST select distinct ? as ? from YES_USER.T_WAP_DOE_INFO where delete_status = 0 and item = ? ? limit 100 DEVICE.TARGET.SELECT_DATA_LIST select distinct ? as ? from YES_USER.T_WAP_TARGET_INFO where delete_status = 0 and ITEM = ? ? limit 100 DEVICE.SUMMARY.MAP_ANALYSIS select b.vt_type as vtType, b.channel_type as channelType, a.source_lot as lotId, a.wafer_id as waferId, a.die_x as dieX, a.die_y as dieY, a.raw_value as rawValue from YES_USER.T_WAP_RAW_DATA_PARSING a join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname and b.delete_status = 0 where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1 and upper(a.test_item) = 'VTSAT' ? ? ? ? ? ? ? ? ? ? ? ? ? DEVICE.SUMMARY.SPLIT_TAB select loop_name as loopName, step_name as stepName, lot_id as lotId, wafer_id as waferId, config_value as configValue, null as targetValue from TDWB_T_PLM_DEVICE_SPLIT_TAB_CONFIG where lot_id in (?) and wafer_id in (?) DEVICE.SUMMARY.DASHBOARD select nvl(c.device_name,a.cell_name) as item, b.vt_type || ' ' || nvl(c.para,a.test_item) as parameterStr, a.source_lot as lotId, a.wafer_id as waferId, a.CONVERT_FILTER_MEDIAN as rawMedian, b.vt_type as vt, d.config_value as target, case when (upper(a.test_item) in ('VTSAT')) then 1 else 0 end as degFlag from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA a join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname and b.delete_status = 0 left join IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG c on a.item = c.item and a.cell_name = c.cellname and a.test_item = c.test_item left join YES_USER.T_WAP_TARGET_INFO d on b.item = d.item and a.cell_name = d.cellname and d.delete_status = 0 and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE and a.test_item = d.CONFIG_KEY and d.config_type = 'targetConfig' where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1 ? ? ? ? ? ? ? ? ? ? ? ? ? DEVICE.SUMMARY.FABS SELECT fab, recipeId, testItem FROM ( SELECT fab AS fab, TEST_RECIPE AS recipeId, test_item AS testItem FROM YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA WHERE LOT_METROLOGY_END_TIME BETWEEN to_date('?', 'YYYY/MM/DD') AND to_date('?', 'YYYY/MM/DD') + 1 GROUP BY fab , TEST_RECIPE, test_item ) DEVICE.SUMMARY.VTSAT_ANALYSIS SELECT a.lot_id AS lotId, a.WAFER_ID AS waferId, CASE WHEN b.channel_type = 'P' THEN a.CONVERT_FILTER_MEDIAN END AS pVtsatY, CASE WHEN b.channel_type = 'N' THEN a.CONVERT_FILTER_MEDIAN END AS nVtsatX from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA a join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname and b.delete_status = 0 left join IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG c on a.item = c.item and a.cell_name = c.cellname and a.test_item = c.test_item left join YES_USER.T_WAP_TARGET_INFO d on b.item = d.item and a.cell_name = d.cellname and d.delete_status = 0 and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE and a.test_item = d.CONFIG_KEY and d.config_type = 'targetConfig' WHERE a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1 and upper(a.test_item) = 'VTSAT' ? ? ? ? ? ? ? ? ? ? ? ? ? DEVICE.DOE.IMPORT_PAGE select project, createDate, operator, updateTime, qty from ( select item as project, CREATE_TIME as createDate, create_user as operator, update_time as updateTime, update_user as updataUser, row_number() over(partition by item order by CREATE_TIME asc) rn , count(1) over(partition by item) as qty from YES_USER.T_WAP_DOE_INFO where delete_status=0) where rn=1 DEVICE.TARGET.IMPORT_PAGE SELECT project, createDate, operator, updateTime, qty FROM ( SELECT item AS project, CREATE_TIME AS createDate, create_user AS createUser, update_time AS updateTime, update_user AS operator, ROW_NUMBER() OVER(PARTITION BY item ORDER BY CREATE_TIME ASC) rn , count(1) OVER(PARTITION BY item) AS qty FROM YES_USER.T_WAP_TARGET_INFO WHERE delete_status = 0) WHERE rn = 1 DEVICE.DEVICE_NAME.SELECT_DATA_LIST select distinct ? as ? from IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG where delete_status = 0 and ITEM = ? ? limit 100 DEVICE.DEVICE_NAME.IMPORT_PAGE SELECT project, createDate, operator, updateTime, qty FROM ( SELECT item AS project, CREATE_DATE AS createDate, CREATE_BY AS createUser, LAST_UPDATE_DATE AS updateTime, LAST_UPDATE_BY AS operator, ROW_NUMBER() OVER(PARTITION BY item ORDER BY CREATE_DATE ASC) rn , count(1) OVER(PARTITION BY item) AS qty FROM IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG WHERE delete_status = 0) WHERE rn = 1 DEVICE.TREND_CHART SELECT a.ID AS id, a.ITEM AS item, a.DEPARTMENT AS department, a.TEST_LAYER AS testLayer, a.SOURCE_LOT AS sourceLot, a.LOT_ID AS lotId, a.WAFER_ID AS waferId, '#'||substr(a.WAFER_ID,-2,2) as waferNum, a.SLOT_ID AS slotId, a.TEST_RECIPE AS testRecipe, a.CELL_NAME AS cellName, a.TEST_ITEM AS testItem, a.PARAMETER_NAME AS parameterName, a.SITE AS site, a.DIE_X AS dieX, a.DIE_Y AS dieY, a.POS AS pos, a.RAW_VALUE AS rawValue, a.CONVERT_VALUE AS convertValue, a.FILTER_FLAG AS filterFlag, a.TARGET_DUT AS targetDut, a.DOE_DUT AS doeDut, a.LOT_METROLOGY_START_TIME AS lotMetrologyStartTime, a.LOT_METROLOGY_END_TIME AS lotMetrologyEndTime, a.CREATE_TIME AS createTime, a.UPDATE_TIME AS updateTime, b.channel_type as channelType, b.nfin as nfin, b.tsk_metal as tskMetal, b.cell_type as cellType, b.cellname as cellName, b.vt_type as vt, b.CHANNEL_LENGTH AS lg, d.CONFIG_VALUE AS target FROM YES_USER.T_WAP_RAW_DATA_PARSING a JOIN YES_USER.T_WAP_DOE_INFO b ON a.item = b.item AND a.cell_name = b.cellname left join YES_USER.T_WAP_TARGET_INFO d on b.item = d.item and a.cell_name = d.cellname and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE and a.test_item = d.CONFIG_KEY and d.config_type = 'targetConfig' --targetȱһ¸ö²ⁿϮ where a.LOT_METROLOGY_END_TIME between to_date('?','YYYY/MM/DD') and to_date('?','YYYY/MM/DD') +1 DEVICE.TREND_CHART.DEFAULT_PROJECT select projectName from ( select item as projectName, row_number() over( order by create_time desc ) rn from YES_USER.T_WAP_DOE_INFO ) where rn = 1 limit 1 DEVICE.TREND_CHART.PROJECT_LIST select item as projectName from YES_USER.T_WAP_DOE_INFO where 1=1 ? group by item DEVICE.TREND_CHART_RAW_FILTER_LIST select fab as fab,TEST_RECIPE as recipeId,test_item as testItem from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA where 1=1 ? group by fab ,TEST_RECIPE,test_item DEVICE.SUMMARY.BOX_PLOT_ANALYSIS select b.vt_type as vtType, b.channel_type as channelType, a.source_lot as lotId, a.wafer_id as waferId, a.die_x as dieX, a.die_y as dieY, a.raw_value as rawValue from YES_USER.T_WAP_RAW_DATA_PARSING a join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname and b.delete_status = 0 where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1 and upper(a.test_item) = 'VTSAT' ? ? ? ? ? ? ? ? ? ? ? ? ? DEVICE.TREND_CHART.FILTER_LIST select channel_type as channelType, nFin as nFin, tsk_metal AS metal, cell_type as bitCellType, cellname as cellName, vt_type as vt, item as project from YES_USER.T_WAP_DOE_INFO where 1=1 ? GROUP BY channel_type ,nFin ,tsk_metal ,cell_type ,cellname ,vt_type ,item DEVICE.TREND_CHART.LOT_OR_WAFER select lotId,waferId from ( select source_lot as lotId ,wafer_id as waferId from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA group by source_lot,wafer_id ) where 1=1 ? ? DEVICE.DETAIL_TARGET_DATA SELECT * FROM ( SELECT ID AS id, ITEM AS item, DEPARTMENT AS department, TARGET_DUT AS targetDut, CONFIG_TYPE AS configType, CONFIG_KEY AS configKey, --test_item CONFIG_VALUE AS configValue, TARGET_FILE_NAME AS targetFileName, CREATE_TIME AS createTime, UPDATE_TIME AS updateTime, CREATE_USER AS createUser, UPDATE_USER AS updateUser, CELLNAME AS cellName, TEMPERATURE AS temperature, VDD AS vdd, DELETE_STATUS AS deleteStatus FROM YES_USER.T_WAP_TARGET_INFO WHERE DELETE_STATUS = 0 ) WHERE 1=1 DEVICE.DETAIL_RAW_DATA select * from ( SELECT a.ID AS id, a.ITEM AS item, a.DEPARTMENT AS department, a.TEST_LAYER AS testLayer, a.SOURCE_LOT AS sourceLot, a.LOT_ID AS lotId, a.WAFER_ID AS waferId, '#'||substr(a.WAFER_ID,-2,2) as waferNum, a.SLOT_ID AS slotId, a.TEST_RECIPE AS testRecipe, a.CELL_NAME AS cellName, a.TEST_ITEM AS testItem, a.PARAMETER_NAME AS parameterName, a.SITE AS site, a.DIE_X AS dieX, a.DIE_Y AS dieY, a.POS AS pos, a.RAW_VALUE AS rawValue, a.CONVERT_VALUE AS convertValue, a.FILTER_FLAG AS filterFlag, a.TARGET_DUT AS targetDut, a.DOE_DUT AS doeDut, a.LOT_METROLOGY_START_TIME AS lotMetrologyStartTime, a.LOT_METROLOGY_END_TIME AS lotMetrologyEndTime, a.CREATE_TIME AS createTime, a.UPDATE_TIME AS updateTime, a.UPDATE_TIME AS updateTime, a.FAB AS fab, b.channel_type as channelType, b.nfin as nfin, b.tsk_metal as tskMetal, b.cell_type as cellType, b.cellname as cellName, b.vt_type as vt FROM YES_USER.T_WAP_RAW_DATA_PARSING a JOIN YES_USER.T_WAP_DOE_INFO b ON a.item = b.item AND a.cell_name = b.cellname AND a.FAB = b.FAB ) WHERE 1=1 DEVICE.DETAIL_DOE_DATA SELECT * FROM ( SELECT b.ID AS id, b.DEPARTMENT AS department, b.ITEM AS item, b.TSK_METAL AS tskMetal, b.CELL_TYPE AS cellType, b.CHANNEL_TYPE AS channelType, b.VT_TYPE AS vtType, b.NFIN AS nfin, b.CHANNEL_LENGTH AS channelLength, b.POLY_PITCH AS polyPitch, b.VDD AS vdd, b.TEMPERATURE AS temperature, b.WITH_DNW AS withDnw, b.BLOCK_NUM AS blockNum, b.DECOUPLE AS decouple, b.TSK_NAME AS tskName, b.FINGER_TYPE AS fingerType, b.DIFFUSION_BREAK AS diffusionBreak, b.STAGE AS stage, b.DIVIDER AS divider, b.M0WIDTH AS m0Width, b.AA AS aa, b.M0GWIDTH AS m0gWidth, b.M0GLENGTH AS m0gLength, b.HIR_LENGTH AS hirLength, b.V0WIDTH AS v0Width, b.V0LENGTH AS v0Length, b.MEASUREMENT AS measurement, b.TYPE_NAME AS typeName, b.FLAG AS flag, b.HIR_WIDTH AS hirWidth, b.CELLNAME AS cellName, b.DOE_DUT AS doeDut, b.TARGET_DUT AS targetDut, b.DOE_FILE_NAME AS doeFileName, b.CREATE_TIME AS createTime, b.UPDATE_TIME AS updateTime, b.CREATE_USER AS createUser, b.UPDATE_USER AS updateUser, b.FAB AS fab FROM YES_USER.T_WAP_DOE_INFO b WHERE b.DELETE_STATUS = 0 ) WHERE 1=1
最新发布
07-22
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