固态硬盘SSD Read Retry的测试方法

Read Retry的本质应该说是一种纠错机制,当page出现ECC不可纠正的读取错误时,通过尝试偏离正常阈值电压的方式找到最接近的阈值电压,试图正确读出数据。


Read Retry与P/E cycle密切相关,测试结果表明,随着P/E cycle的增加,阈值电压向右偏移,且电压分布的幅度更宽。通俗来讲,随着P/E cycle次数的增加,正确编程(Program)需要比阈值电压更高的电压,同时,编程时的电压精度变的更差了。




既然阈值电压已经发生了偏移,读取时仍然用正常的读取电压去读取,发生错误就在所难免,因此,读取时也需要将读取电压向右进行相应的偏移才能正确读取数据。


测试流程(参考某3D Nand Flash流程图,ReadRetry部分Parameter1的参数设定不一定完全依照datasheet)




Parameter的设定每个厂商不尽一致,请参考datasheet,一般来说,可以从01-07或者更多参数进行尝试。


测试方法:


1、在set features中,设置address为89h;



2、在sub-parameter中,将parameter1的参数从01开始进行多个参数的设定尝试,如:01,02,03,04……



3、对需要测试的Block进行一次Erase-Program操作,然后去读取写入的数据,获取在一定ECC条件下的误码率,直到相应参数对应的误码率为零。

用NFA100-E测试时,在对既定block进行program后,只需要用Read Only即可。





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NAND flash memory is widely used in electronic devices such as smartphones, tablets, and solid-state drives (SSDs). During the reading process, errors can occur due to various factors such as noise and interference. To improve the reliability of data reading, NAND flash memory controllers implement two techniques: re-read and read retry. Re-read is a technique where the memory controller reads the same data multiple times and compares the results to detect errors. If the results are inconsistent, the controller will perform another read operation until it gets a consistent result. Re-read is a simple and effective technique to detect and correct errors. Read retry is a more advanced technique that involves adjusting the read parameters of the memory controller based on the characteristics of the NAND flash memory. Read parameters such as read voltage and read latency can be adjusted to improve the reliability of data reading. Read retry requires more complex algorithms and can improve the performance of the NAND flash memory in high-noise environments. In summary, re-read and read retry are two techniques used by NAND flash memory controllers to improve the reliability of data reading. Re-read is a simple and effective technique that reads the same data multiple times and compares the results to detect errors. Read retry is a more advanced technique that adjusts the read parameters of the memory controller based on the characteristics of the NAND flash memory to improve the reliability of data reading.

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