WGL, STIL, VCD, or EVCD

WGL, STIL, VCD, or EVCD

The Test Insight tool suite includes WaveWizard, ScanConverter and HDLLink,
providing for the conversion of STIL, WGL, VCD and EVCD formatted digital patterns from EDA environments to the IG-XL test operating software.

WaveWizard provides automatic pattern conversion capability to generate test programs from design simulation data.
The ScanConverter software tool converts WGL or STIL based scan tests into tester formatted patterns and timing.
The HDLLink test program simulation and debug environment can create a Verilog testbench for WaveWizard projects to support the simulation and debug of devices

• Supported EDA formats:VCD, eVCD, WGL, STIL
• Supported ATE formats: V93K, Teradyne IG-XL J750, Flex, UltraFlex, T2000, ETS800

The Standard Test Interface Language (STIL, IEEE-1450) was developed by a consortium of several test equipment vendors, computer aided engineering (CAE), computer aided design (CAD) and integrated circuit (IC) vendors. The standard provides a common language to transfer digital test data vectors from the design environment to the test environment.

The Waveform Generation Language (WGL), pronounced “wiggle”, is a data description language created by Test System Strategies Inc. (TSSI). A WGL file is essentially a text file that contains signal patterns along with timing, diagnostics and other information. The WGL vector formats are commonly used by engineers to test semiconductor devices during the design validation and production test phases of product development. These vectors are generated by electronic design automation (EDA) tools and are used to test a device and verify that its physical implementation matches the results achieved in simulation.

The VCD and EVCD file formats are part of the IEEE-1364 (IEEE Standard for Verilog® Hardware Description Language). Extended VCD (EVCD, IEEE-1364-2001) is a newer version of the VCD file format and supports directional data.