研究背调：漏洞检测、渗透测试

漏洞检测是目前正在做的一款产品，从检测目标角度可以分为系统漏洞和应用漏洞。个人感觉是偏工程应用的方向。技术方案大于学术研究。当然从理论角度可能没有大的突破，但是需要关注学术领域的研究成果。从技术上大致分为静态检测和动态检测

研究路线：

按照漏洞检测、渗透测试等关键字调研综述性论文，概览当前的研究成果

市面上开源的扫描技术

IEEE论文发表量：

2015	219
2016	259
2017	310
2018	318
2019	423
2020	482
2021	367

研究成果：

[1]张芸、刘佳琨、夏鑫、吴明晖、颜晖. 基于信息检索的软件缺陷定位技术研究进展[J]. 软件学报, 2020, v.31(08):154-174.

[2]R. Tommy, G. Sundeep and H. Jose, "Automatic Detection and Correction of Vulnerabilities using Machine Learning," 2017 International Conference on Current Trends in Computer, Electrical, Electronics and Communication (CTCEEC), 2017, pp. 1062-1065, doi: 10.1109/CTCEEC.2017.8454995.

[3]W. Ze, "Design and Implementation of Core Modules of WEB Application Vulnerability Detection Model," 2019 11th International Conference on Measuring Technology and Mechatronics Automation (ICMTMA), 2019, pp. 10-14, doi: 10.1109/ICMTMA.2019.00009.

[4]A. Warzyński and G. Kołaczek, "Intrusion detection systems vulnerability on adversarial examples," 2018 Innovations in Intelligent Systems and Applications (INISTA), 2018, pp. 1-4, doi: 10.1109/INISTA.2018.8466271.

[5]C. Zhang, J. Chen, S. Cai, B. Liu, Y. Wu and Y. Geng, "iTES: Integrated Testing and Evaluation System for Software Vulnerability Detection Methods," 2020 IEEE 19th International Conference on Trust, Security and Privacy in Computing and Communications (TrustCom), 2020, pp. 1455-1460, doi: 10.1109/TrustCom50675.2020.00196.

[6]Z. Jin and Y. Yu, "Current and Future Research of Machine Learning Based Vulnerability Detection," 2018 Eighth International Conference on Instrumentation & Measurement, Computer, Communication and Control (IMCCC), 2018, pp. 1562-1566, doi: 10.1109/IMCCC.2018.00322.

[7]J. D. Pereira, "Techniques and Tools for Advanced Software Vulnerability Detection," 2020 IEEE International Symposium on Software Reliability Engineering Workshops (ISSREW), 2020, pp. 123-126, doi: 10.1109/ISSREW51248.2020.00049.

[8]H. Zhang, Y. Bi, H. Guo, W. Sun and J. Li, "ISVSF: Intelligent Vulnerability Detection Against Java via Sentence-Level Pattern Exploring," in IEEE Systems Journal, doi: 10.1109/JSYST.2021.3072154.