“Failures“ in Functional Safety

原文链接：https://www.nisshinbo-microdevices.co.jp/en/applications/automotive-introduction/fault.html

Functional Safety is based on the idea of preparing for the risk as failure occurs. If there are no failures in electronic parts and/or systems in the first place, it would have no trouble and would secure a safe condition in driving.

It is very difficult to make no electronic part failures and/or system failures. Therefore, parts makers are required to lower the failure rate.

In the system, the failure rate is reduced by measures such as defect monitoring and/or redundant circuits.

It is important to reduce the residual failure rate by raising the fault coverage rate for electronic components.

What can you imagine about failures of electronic components? We will explain “failure” in functional safety and electronic component failure rate.

Failure Classification

There are some kinds of failures, including a fatal failure that is described in “Functional Safety” section, and the others which are not fatal. The single-point failure of voltage detector which is added as a functional safety mechanism is not a fatal failure, for instance.

Failure Classification caused by various factors is defined in ISO26262. The four main classifications are shown below:

Failure Classification : ISO26262

Failure Classification Chart

By increasing the fault coverage as much as possible, it needs to build safety mechanism that will not result in fatal failure by a single-fault.

Concept of Failure Rate

For automotive applications, there are four safety requirement levels (ASIL: Automotive Safety Integrity Level) from A to D for electronic parts. A is low, D is the highest request level.

Semiconductor failure rate λ

The FIT is calculated from IEC TR 62380 standard model and defined from the following formula.

  λ = λ die + λ package

λdie; By improving the internal circuit and increasing the coverage, the failure rate can be lowered.
λpkg; Countermeasures against open faults are important points to lower the failure rate, since open fault is calculated at 90% and short fault is calculated at 10%.

In order to lower the failure rate λ as a product, it is necessary to reduce all the failure rates.