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数字后端
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数字后端基础知识介绍
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Memory Testing: MBIST, BIRA & BISR | An Insight into Algorithms and Self Repair Mechanism
原文链接:https://www.einfochips.com/blog/memory-testing-an-insight-into-algorithms-and-self-repair-mechanism/Deep submicron devices contain a large number of memories which demands lower area and fast access time, hence, an automated test strategy for such des转载 2023-12-29 15:20:01 · 485 阅读 · 0 评论 -
数字后端基础知识入门
原文链接:https://www.vlsi-backend-adventure.com/index.html原创 2023-10-09 19:58:21 · 113 阅读 · 0 评论