可测性设计：关于Rombist

关于EmbeddedMemories

•   随着半导体工艺的发展,可测性技术(DFT)成为每个芯片在设计中必须考虑的问题

•   如何高效和高质量的测试芯片中的内嵌Memory,成为DFT技术中的关键技术

•  本文针对rombist中的Memorymodel的产生算法和结果做一个分析和总结

•   实际案例的具体分析和计算

•   希望对大家的面试和工作有帮助

MBIST Architect Architecture

•   General Memory bist structure :

When Should we Use Memory BIST?

•   User should use Memory BIST:

•      On medium to large embedded memories

•      On memories that are contained within Intellectual Property (IP)that will be reused

•      On memories that should be tested at speed

•      On devices with multiple embedded memories

•      On devices that are time-to-market critical

•      On devices that run on ATEs with limited capability

•      On SoCs where testing and verification will be difficult

Advantages of Adding BIST

•    Enables Intellectual Property (IP) reuse

•    Reduces test application time and simplifies pattern generation

•    Reduces amount of test data to store

•    Facilitates hierarchical test capabilities -- lets you easily testat model, block, design, and system levels

•    Merges test and design, reducing development time

•    BIST controller can be shared across memories

Disadvantages of Adding BIST

•    Small area increase

•    Adds Mux delay to memory data path

•    Not as flexible as direct access testing

•    Small routing and timing impact

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转载于:https://www.cnblogs.com/xgcl-wei/p/9048270.html