DEVICE.SUMMARY.TAB_FILTER with tlist as(
select nvl(c.device_name,a.cell_name) as item,
b.vt_type || ' ' || nvl(c.para,a.test_item) as parameterStr
from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA a
join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname
and b.delete_status = 0
left join IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG c on a.item = c.item and a.cell_name = c.cellname and a.test_item = c.test_item
left join YES_USER.T_WAP_TARGET_INFO d
on b.item = d.item and a.cell_name = d.cellname
and d.delete_status = 0
and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE
and a.test_item = d.CONFIG_KEY
and d.config_type = 'targetConfig'
where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1
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)
SELECT distinct item,parameterStr from tlist
where 1=1
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DEVICE.SUMMARY.SPLIT_TAB_FILTER select loopName,stepName from(
select loop_name as loopName,
step_name as stepName
from TDWB_T_PLM_DEVICE_SPLIT_TAB_CONFIG
where
1=1
?
?
group by loop_name,step_name
) limit 100
DEVICE.DOE.SELECT_DATA_LIST select
distinct ? as ?
from YES_USER.T_WAP_DOE_INFO
where delete_status = 0
and item = ?
?
limit 100
DEVICE.TARGET.SELECT_DATA_LIST select
distinct ? as ?
from YES_USER.T_WAP_TARGET_INFO
where delete_status = 0
and ITEM = ?
?
limit 100
DEVICE.SUMMARY.MAP_ANALYSIS select b.vt_type as vtType,
b.channel_type as channelType,
a.source_lot as lotId,
a.wafer_id as waferId,
a.die_x as dieX,
a.die_y as dieY,
a.raw_value as rawValue
from YES_USER.T_WAP_RAW_DATA_PARSING a
join YES_USER.T_WAP_DOE_INFO b
on a.item = b.item
and a.cell_name = b.cellname
and b.delete_status = 0
where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1
and upper(a.test_item) = 'VTSAT'
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DEVICE.SUMMARY.SPLIT_TAB select loop_name as loopName,
step_name as stepName,
lot_id as lotId,
wafer_id as waferId,
config_value as configValue,
null as targetValue
from TDWB_T_PLM_DEVICE_SPLIT_TAB_CONFIG
where lot_id in (?)
and wafer_id in (?)
DEVICE.SUMMARY.DASHBOARD select nvl(c.device_name,a.cell_name) as item,
b.vt_type || ' ' || nvl(c.para,a.test_item) as parameterStr,
a.source_lot as lotId,
a.wafer_id as waferId,
a.CONVERT_FILTER_MEDIAN as rawMedian,
b.vt_type as vt,
d.config_value as target,
case when (upper(a.test_item) in ('VTSAT')) then 1 else 0 end as degFlag
from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA a
join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname
and b.delete_status = 0
left join IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG c on a.item = c.item and a.cell_name = c.cellname and a.test_item = c.test_item
left join YES_USER.T_WAP_TARGET_INFO d
on b.item = d.item and a.cell_name = d.cellname
and d.delete_status = 0
and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE
and a.test_item = d.CONFIG_KEY
and d.config_type = 'targetConfig'
where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1
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DEVICE.SUMMARY.FABS SELECT
fab,
recipeId,
testItem
FROM
(
SELECT
fab AS fab,
TEST_RECIPE AS recipeId,
test_item AS testItem
FROM
YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA
WHERE
LOT_METROLOGY_END_TIME BETWEEN to_date('?',
'YYYY/MM/DD') AND to_date('?',
'YYYY/MM/DD') + 1
GROUP BY
fab ,
TEST_RECIPE,
test_item
)
DEVICE.SUMMARY.VTSAT_ANALYSIS SELECT
a.lot_id AS lotId,
a.WAFER_ID AS waferId,
CASE WHEN b.channel_type = 'P' THEN a.CONVERT_FILTER_MEDIAN END AS pVtsatY,
CASE WHEN b.channel_type = 'N' THEN a.CONVERT_FILTER_MEDIAN END AS nVtsatX
from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA a
join YES_USER.T_WAP_DOE_INFO b on a.item = b.item and a.cell_name = b.cellname
and b.delete_status = 0
left join IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG c on a.item = c.item and a.cell_name = c.cellname and a.test_item = c.test_item
left join YES_USER.T_WAP_TARGET_INFO d
on b.item = d.item and a.cell_name = d.cellname
and d.delete_status = 0
and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE
and a.test_item = d.CONFIG_KEY
and d.config_type = 'targetConfig'
WHERE a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1
and upper(a.test_item) = 'VTSAT'
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DEVICE.DOE.IMPORT_PAGE select
project,
createDate,
operator,
updateTime,
qty
from (
select
item as project,
CREATE_TIME as createDate,
create_user as operator,
update_time as updateTime,
update_user as updataUser,
row_number() over(partition by item order by CREATE_TIME asc) rn ,
count(1) over(partition by item) as qty
from YES_USER.T_WAP_DOE_INFO
where delete_status=0)
where rn=1
DEVICE.TARGET.IMPORT_PAGE SELECT
project,
createDate,
operator,
updateTime,
qty
FROM
(
SELECT
item AS project,
CREATE_TIME AS createDate,
create_user AS createUser,
update_time AS updateTime,
update_user AS operator,
ROW_NUMBER() OVER(PARTITION BY item
ORDER BY
CREATE_TIME ASC) rn ,
count(1) OVER(PARTITION BY item) AS qty
FROM
YES_USER.T_WAP_TARGET_INFO
WHERE
delete_status = 0)
WHERE
rn = 1
DEVICE.DEVICE_NAME.SELECT_DATA_LIST select
distinct ? as ?
from IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG
where delete_status = 0
and ITEM = ?
?
limit 100
DEVICE.DEVICE_NAME.IMPORT_PAGE SELECT
project,
createDate,
operator,
updateTime,
qty
FROM
(
SELECT
item AS project,
CREATE_DATE AS createDate,
CREATE_BY AS createUser,
LAST_UPDATE_DATE AS updateTime,
LAST_UPDATE_BY AS operator,
ROW_NUMBER() OVER(PARTITION BY item
ORDER BY
CREATE_DATE ASC) rn ,
count(1) OVER(PARTITION BY item) AS qty
FROM
IWORKSMGR.TDWB_T_PLM_DEVICE_DVNAME_CONFIG
WHERE
delete_status = 0)
WHERE
rn = 1
DEVICE.TREND_CHART SELECT a.ID AS id,
a.ITEM AS item,
a.DEPARTMENT AS department,
a.TEST_LAYER AS testLayer,
a.SOURCE_LOT AS sourceLot,
a.LOT_ID AS lotId,
a.WAFER_ID AS waferId,
'#'||substr(a.WAFER_ID,-2,2) as waferNum,
a.SLOT_ID AS slotId,
a.TEST_RECIPE AS testRecipe,
a.CELL_NAME AS cellName,
a.TEST_ITEM AS testItem,
a.PARAMETER_NAME AS parameterName,
a.SITE AS site,
a.DIE_X AS dieX,
a.DIE_Y AS dieY,
a.POS AS pos,
a.RAW_VALUE AS rawValue,
a.CONVERT_VALUE AS convertValue,
a.FILTER_FLAG AS filterFlag,
a.TARGET_DUT AS targetDut,
a.DOE_DUT AS doeDut,
a.LOT_METROLOGY_START_TIME AS lotMetrologyStartTime,
a.LOT_METROLOGY_END_TIME AS lotMetrologyEndTime,
a.CREATE_TIME AS createTime,
a.UPDATE_TIME AS updateTime,
b.channel_type as channelType,
b.nfin as nfin,
b.tsk_metal as tskMetal,
b.cell_type as cellType,
b.cellname as cellName,
b.vt_type as vt,
b.CHANNEL_LENGTH AS lg,
d.CONFIG_VALUE AS target
FROM YES_USER.T_WAP_RAW_DATA_PARSING a
JOIN YES_USER.T_WAP_DOE_INFO b ON a.item = b.item AND a.cell_name = b.cellname
left join YES_USER.T_WAP_TARGET_INFO d
on b.item = d.item and a.cell_name = d.cellname
and b.vdd = d.vdd and b.TEMPERATURE = d.TEMPERATURE
and a.test_item = d.CONFIG_KEY
and d.config_type = 'targetConfig' --targetȱһ¸ö²ⁿϮ
where a.LOT_METROLOGY_END_TIME between to_date('?','YYYY/MM/DD') and to_date('?','YYYY/MM/DD') +1
DEVICE.TREND_CHART.DEFAULT_PROJECT select projectName
from (
select item as projectName,
row_number() over( order by create_time desc ) rn
from YES_USER.T_WAP_DOE_INFO
)
where rn = 1 limit 1
DEVICE.TREND_CHART.PROJECT_LIST select item as projectName
from YES_USER.T_WAP_DOE_INFO
where 1=1
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group by item
DEVICE.TREND_CHART_RAW_FILTER_LIST select fab as fab,TEST_RECIPE as recipeId,test_item as testItem
from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA
where 1=1
?
group by fab ,TEST_RECIPE,test_item
DEVICE.SUMMARY.BOX_PLOT_ANALYSIS select b.vt_type as vtType,
b.channel_type as channelType,
a.source_lot as lotId,
a.wafer_id as waferId,
a.die_x as dieX,
a.die_y as dieY,
a.raw_value as rawValue
from YES_USER.T_WAP_RAW_DATA_PARSING a
join YES_USER.T_WAP_DOE_INFO b
on a.item = b.item
and a.cell_name = b.cellname
and b.delete_status = 0
where a.LOT_METROLOGY_END_TIME between to_date(?,'YYYY/MM/DD') and to_date(?,'YYYY/MM/DD') +1
and upper(a.test_item) = 'VTSAT'
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DEVICE.TREND_CHART.FILTER_LIST select channel_type as channelType,
nFin as nFin,
tsk_metal AS metal,
cell_type as bitCellType,
cellname as cellName,
vt_type as vt,
item as project
from YES_USER.T_WAP_DOE_INFO
where 1=1
?
GROUP BY channel_type ,nFin ,tsk_metal ,cell_type ,cellname ,vt_type ,item
DEVICE.TREND_CHART.LOT_OR_WAFER select lotId,waferId
from (
select source_lot as lotId ,wafer_id as waferId
from YES_USER.T_WAP_RAW_PARSING_SUMMARY_DATA
group by source_lot,wafer_id
)
where 1=1
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DEVICE.DETAIL_TARGET_DATA SELECT
*
FROM
(
SELECT
ID AS id,
ITEM AS item,
DEPARTMENT AS department,
TARGET_DUT AS targetDut,
CONFIG_TYPE AS configType,
CONFIG_KEY AS configKey, --test_item
CONFIG_VALUE AS configValue,
TARGET_FILE_NAME AS targetFileName,
CREATE_TIME AS createTime,
UPDATE_TIME AS updateTime,
CREATE_USER AS createUser,
UPDATE_USER AS updateUser,
CELLNAME AS cellName,
TEMPERATURE AS temperature,
VDD AS vdd,
DELETE_STATUS AS deleteStatus
FROM
YES_USER.T_WAP_TARGET_INFO
WHERE
DELETE_STATUS = 0
)
WHERE 1=1
DEVICE.DETAIL_RAW_DATA select * from (
SELECT a.ID AS id,
a.ITEM AS item,
a.DEPARTMENT AS department,
a.TEST_LAYER AS testLayer,
a.SOURCE_LOT AS sourceLot,
a.LOT_ID AS lotId,
a.WAFER_ID AS waferId,
'#'||substr(a.WAFER_ID,-2,2) as waferNum,
a.SLOT_ID AS slotId,
a.TEST_RECIPE AS testRecipe,
a.CELL_NAME AS cellName,
a.TEST_ITEM AS testItem,
a.PARAMETER_NAME AS parameterName,
a.SITE AS site,
a.DIE_X AS dieX,
a.DIE_Y AS dieY,
a.POS AS pos,
a.RAW_VALUE AS rawValue,
a.CONVERT_VALUE AS convertValue,
a.FILTER_FLAG AS filterFlag,
a.TARGET_DUT AS targetDut,
a.DOE_DUT AS doeDut,
a.LOT_METROLOGY_START_TIME AS lotMetrologyStartTime,
a.LOT_METROLOGY_END_TIME AS lotMetrologyEndTime,
a.CREATE_TIME AS createTime,
a.UPDATE_TIME AS updateTime,
a.UPDATE_TIME AS updateTime,
a.FAB AS fab,
b.channel_type as channelType,
b.nfin as nfin,
b.tsk_metal as tskMetal,
b.cell_type as cellType,
b.cellname as cellName,
b.vt_type as vt
FROM YES_USER.T_WAP_RAW_DATA_PARSING a
JOIN YES_USER.T_WAP_DOE_INFO b ON a.item = b.item AND a.cell_name = b.cellname
AND a.FAB = b.FAB
)
WHERE 1=1
DEVICE.DETAIL_DOE_DATA SELECT * FROM (
SELECT
b.ID AS id,
b.DEPARTMENT AS department,
b.ITEM AS item,
b.TSK_METAL AS tskMetal,
b.CELL_TYPE AS cellType,
b.CHANNEL_TYPE AS channelType,
b.VT_TYPE AS vtType,
b.NFIN AS nfin,
b.CHANNEL_LENGTH AS channelLength,
b.POLY_PITCH AS polyPitch,
b.VDD AS vdd,
b.TEMPERATURE AS temperature,
b.WITH_DNW AS withDnw,
b.BLOCK_NUM AS blockNum,
b.DECOUPLE AS decouple,
b.TSK_NAME AS tskName,
b.FINGER_TYPE AS fingerType,
b.DIFFUSION_BREAK AS diffusionBreak,
b.STAGE AS stage,
b.DIVIDER AS divider,
b.M0WIDTH AS m0Width,
b.AA AS aa,
b.M0GWIDTH AS m0gWidth,
b.M0GLENGTH AS m0gLength,
b.HIR_LENGTH AS hirLength,
b.V0WIDTH AS v0Width,
b.V0LENGTH AS v0Length,
b.MEASUREMENT AS measurement,
b.TYPE_NAME AS typeName,
b.FLAG AS flag,
b.HIR_WIDTH AS hirWidth,
b.CELLNAME AS cellName,
b.DOE_DUT AS doeDut,
b.TARGET_DUT AS targetDut,
b.DOE_FILE_NAME AS doeFileName,
b.CREATE_TIME AS createTime,
b.UPDATE_TIME AS updateTime,
b.CREATE_USER AS createUser,
b.UPDATE_USER AS updateUser,
b.FAB AS fab
FROM YES_USER.T_WAP_DOE_INFO b
WHERE b.DELETE_STATUS = 0
) WHERE 1=1