这篇白皮书介绍了Teradyne系统级测试部门的PeterReichert关于SLT（系统级测试）的概念，它通过在最终使用系统中直接测试设备而非创建传统ATE测试向量，以提高产品质量并缩短上市时间。
原文链接：https://www.teradyne.com/2022/02/11/system-level-test-a-primer-white-paper/
As semiconductor geometries become smaller and greater complexity is pushed into chips or packages, System Level Test (SLT) is becoming essential.
Peter Reichert, System Architect for Teradyne’s System Level Test division discusses what System Level Test is, and how it can improve final product quality and reduce time to market.
TABLE OF CONTENTS & EXCERPT
System Level Test (SLT) is testing a device under test (DUT) as it is used in the end-use system, by merely using it rather than creating test vectors, as is done with traditional automated test equipment (ATE). Tests are still written but in a different way…
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