在dexnet 2.0中
提到了 using robust quasi-static GWS analysis on a dataset of 1,500 3D object models
E
Q
E_Q
EQ is the robust epsilon quality defined in
where EQ is the robust epsilon quality defined in [51],
Daniel Seita, Florian T Pokorny, Jeffrey Mahler, Danica Kragic,
Michael Franklin, John Canny, and Ken Goldberg. Large-scale supervised learning of the grasp robustness of surface patch pairs. In
Proc. IEEE Int. Conf. on Simulation, Modeling, and Programming of
Autonomous Robots (SIMPAR). IEEE, 2016.
a variant of the pose error robust metric [56] that includes
uncertainty in friction and gripper pose,
Jonathan Weisz andPeter KAllen. Poseerror robust grasping from
contact wrench space metrics. In Proc. IEEE Int. Conf. Robotics and
Automation (ICRA), pages 557–562. IEEE, 2012.
the ability
to resist external wrenches [43],
For each grasp we evaluate the
expected epsilon quality EQ [43] under object pose, gripper
pose, and friction coefficient uncertainty using Monte-Carlo
sampling [51],
[43] Florian T Pokorny and Danica Kragic. Classical grasp quality
evaluation: New algorithms and theory. In Proc. IEEE/RSJ Int. Conf.
on Intelligent Robots and Systems (IROS), pages 3493–3500. IEEE,
2013.
Towards Precise Model-free Robotic Grasping
with Sim-to-Real Transfer Learning
这篇论文中提到了:
Ferrari–Canny metric
J. Canny and C. Ferrari, “Planning optimal grasps,” in Proc. Conf. on Robotics and Automation (ICRA), vol. 1992, 1992, pp. 2290–2295.
grasp wrench space (GWS)
C. Borst, M. Fischer, and G. Hirzinger, “Grasp planning: How to
choose a suitable task wrench space,” in IEEE International Confer
ence on Robotics and Automation, 2004. Proceedings. ICRA’04. 2004,
vol. 1. IEEE, 2004, pp. 319–325.
dexnet 2.0里面 grasp wrench space (GWS) analysis 【45】
robust GWS analysis 【56】
[45] Domenico Prattichizzo and Jeffrey C Trinkle. Grasping. In
Springer handbook of robotics, pages 671–700. Springer, 2008.
[56]
Jonathan Weisz andPeter KAllen. Poseerror robust grasping from
contact wrench space metrics. In Proc. IEEE Int. Conf. Robotics and
Automation (ICRA), pages 557–562. IEEE, 2012.