agilent 42841A 安捷伦4285A CR测量仪的能力和应用

所提供的文本描述了安捷伦LCR测量仪的能力和应用，特别是安捷伦4284A和安捷伦428 5A型号，用于表征电感器件、进行低频和高频测量、精确的陶瓷电容器测量、高直流电流偏置引起的电感滚降、半导体样品的C-V特性以及适应性参数测试。以下是摘要：
安捷伦4284A：
低频测量：
在20赫兹到1兆赫的范围内准确地描述感应设备的特性。
启用扫描高电流条件。
准确识别设备属性。

高频测量：
允许测试范围从75 kHz到30 MHz的射频电感器。
提供更高的精度和0.001 nH的分辨率。
适用于测试磁头、铁氧体磁芯和功率电感器。

陶瓷电容器的精确测量：
在陶瓷材料的主频率1 kHz和1 MHz下进行测试。
以卓越的精度和6位数的分辨率将测量值解析为低值。
保持恒定的信号电平以实现可靠和一致的测量。

安捷伦4285A：
高频测量：
覆盖从75 kHz到30 MHz的宽频率范围。
允许以提高的精度和0.001 nH的分辨率测试RF电感器。
适用于磁头、铁氧体磁芯和功率电感器测试。

自适应参数测试：
提供高精度、精确的测量、宽频率范围以及高测试信号和偏置水平。
利用安捷伦16451B介电测试夹具进行精确的介电常数和损耗因数测量。
提供可变电压和电流测试信号电平控制。

半导体测试：
使前面板测量端口能够通过测试电缆、开关和探测器直接延伸到DUT。
6位数的分辨率允许感测和识别传统LCR测量仪通常看不到的变化。
在高达1MHz的关键测试频率下精确，用于完整的DUT评估。

高速设备测试：
适用于频率高于1MHz的高速器件测试。
总之，这些安捷伦LCR测量仪为各种应用中的一系列测量提供了全面的解决方案，为材料表征和半导体测试提供了准确性、精密度和适应性。

The provided text describes the capabilities and applications of Agilent LCR meters, specifically the Agilent 4284A and Agilent 4285A models, for characterizing inductive devices, conducting low and high-frequency measurements, precise ceramic capacitor measurements, inductance rolloff due to high dc current bias, C-V characteristics for semiconductor samples, and adaptable parameter testing. Here's a summary:

Agilent 4284A:

1. Low-Frequency Measurements:

   • Characterizes inductive devices accurately from 20 Hz to 1 MHz.
   • Enables sweep high current conditions.
   • Identifies device properties precisely.

2. High-Frequency Measurements:

   • Allows testing of RF inductors with a wide range from 75 kHz to 30 MHz.
   • Offers improved accuracy and 0.001 nH resolution.
   • Suitable for testing magnetic heads, ferrite cores, and power inductors.

3. Precise Ceramic Capacitor Measurements:

   • Tests at 1 kHz and 1 MHz, the primary frequencies for ceramic materials.
   • Resolves measurements to low values with excellent accuracy and 6-digit resolution.
   • Maintains constant signal levels for reliable and consistent measurements.

Agilent 4285A:

1. High-Frequency Measurements:

   • Covers a wide frequency range from 75 kHz to 30 MHz.
   • Allows testing of RF inductors with improved accuracy and 0.001 nH resolution.
   • Ideal for magnetic heads, ferrite cores, and power inductors testing.

2. Adaptable Parameter Testing:

   • Provides high accuracy, precise measurements, wide frequency ranges, and high test signal and bias levels.
   • Utilizes the Agilent 16451B dielectric test fixture for accurate permittivity and dissipation factor measurements.
   • Offers variable voltage and current test signal level control.

3. Semiconductor Testing:

   • Enables extending the front panel measurement port through test cables, switches, and probers directly to the DUT.
   • 6-digits of resolution allow sensing and identifying changes not normally seen by conventional LCR meters.
   • Accurate at key test frequencies up to 1 MHz for complete DUT evaluation.

4. High-Speed Device Testing:

   • Suitable for high-speed device testing at frequencies above 1 MHz.

In summary, these Agilent LCR meters provide a comprehensive solution for a range of measurements in various applications, offering accuracy, precision, and adaptability for material characterization and semiconductor testing.