文献阅读(170)Chiplet规范

文章目录

ODSA

  • 题目:The Open Domain-Specific Architecture
  • 时间:2020
  • 期刊:IEEE Micro
  • 研究机构:圣何塞州立大学/微软/Facebook/NXP/Xilinx

ODSA的目的是为chiplet建立开放的物理与逻辑D2D接口

The open domain specific architecture (ODSA) is a project within the open compute project (OCP) community that aims to establish open physical and logical D2D interfaces for chiplets.

需要解决3个挑战:

  1. Developing an open physical and logical D2D interface
  2. Enabling workflows with these interfaces: formats for information exchange for manufacture, test, and debug
  3. Developing prototypes for these interfaces: the first is a platform to prototype CBP(Chiplet-based products) designs

在这里插入图片描述

OS


BoW

  • 题目:Chiplet Communication Link: Bunch of Wires (BoW)
  • 时间:2020
  • 期刊:IEEE Micro

BoW是一种开放的D2D接口,用来平衡性能与封装的复杂度,支持320Gb/s/mm到1+Tb/s/mm不同的速率
BoW的设计目标:

  1. 一组向后兼容的D2D接口
  2. 成本低廉,对于不同设计和封装复杂度可以灵活的tradeoff

Inexpensive to implement with the flexibility to tradeoff throughput per wire for design, and packaging complexity

  1. 制程从65nm到5nm的可移植性,支持不同的bump pitch和封装技术

BoW具有两种模式,BoW Basic和BoW Fast,其中

  • BoW Basic:最大8Gbps速率,在silicon interposer上1mm间距,在organic interposer上5mm间距
  • BoW Fast:最大16Gbps速率

**Interoperation With Parallel D2D Interfaces: ** 支持AIB, HBM, Open HBI

In the data plane, a BoW slice can be electrically connected with an AIB Channel with up to 18 signal wires.

如果bump pitch更小(如40mm),那么引脚密度就大,传输速率就可以小一点;如果bump pitch很大(如130mm),引脚密度低,传输速率就可以设置的大一点,这样的话传输带宽都差不多。

One observation is that nearly equivalent bandwidth density per mm of chip edge is achievable by either implementing a lower data rate BoW (5 Gb/s) at a denser 40-mm bump pitch or a higher data rate BoW (16 Gb/s) with a less-dense 130-mm bump pitch, with the latter occupying less overall silicon area.

The ODSA also has a set of activities to develop collateral to make the interface easier to use including:
a) a test chip and a packaging prototype;
b) Interface adapters to carry off-package (PCIe, CXL, CCIX) and on-die (AXI, TileLink) protocols on D2D interfaces;
c) A proposal to build a test probe card based on the reference bump pattern

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