数字IC设计随笔之五（常用术语）

ASIC：Application Specific Integrated Circuit
FPGA：Field Programmable Gate Array
HDL： Hardware Description Languages
IP：Intellectual Property

LUT：Look-Up-Table
DFT: Design For Testability
BIST：Built In Self Test
ATPG：Automatic Test Pattern Generator
ATE：Automatic Test Equipment
STIL：Standard Test Interfance Language
LVS： Layout vs. Schematic
DRC：Design Rule Check
ERC：Electronic Rule Check
ECO: Engineering Change Order

GDSII：Graphics Design Standard Format II
PV：Physical Verication
CTS：Clock Tree Synthesis
MVS：Multi Voltage Supply
LEF ：Library Exchange Format
DEF：Design Exchange Format

NLDM：Non-Linear Delay Model
CCS：Composite Current Source
OCV：On Chip Variation
SI：Signal Integrity
STA: Static Timing Analysis
SDC：Synopsys Design Constraints
SPEF：Standard Parasitic Extraction Format
SDF：Standard Delay Format

AT：Arrival Time
RAT：Required Arrival Time

.itf：interconnect technology format file
.tf：technology file