1. 几个概念
1、结温(Tj),指的是IC的结点(junction)的温度,一般来说最高温度为125℃,由晶体硅工艺决定。非常值得注意的是,这里所说的125℃其实更多的指的是芯片正常工作时的温度(如Timing约束等),但是,即使超过125℃,如135℃,一般芯片也不会有损伤的。
2、环温(Ta),指的是环境(ambient)的温度。
3、壳温(Tc),指的是IC表面外壳(case)的温度。
4、功耗(PD),耗散功率,单位是W。
5、热阻(Rθ),温升除以PD,单位是℃/W。
6、热阻θJA,The intent of θJA measurements is solely for a thermal performance comparison of one package to another in a standardized environment. This methodology is not meant to and will not predict the performance of a package in an application-specific environment.
JESD51-2明确说,θJA只是用来对比封装性能,不应该也不能用来估算结温。但是,实际上利用θJA来计算结温在某些情况下还是可取的(下文1.2.1小节例子)。
1.1 Psi(ψ)和Theta(θ)的区别
ψ:The temperature difference between point X to point Y if the total heat is known. The heat flowing along the specific path point X to point Y is NOT known.
-- This parameter typically serves for estimation of Junction temperature (TJ) at known total dissipated power (PD) inside the package when a temperature is measured at package perimeter (Lead, Exposed Pad, Board, etc.)
-- 热特征参数ψ指的是不确定热传播路径的情况,ψjt经常用来计算结温(和PCB强相关)。
θ:The amount of heat that flows from point X to point Y if the temperatures at X and Y points are known (connected by the thermal resistance). The path the heat flows is known and it is completely determined by the resistance.
-- 热阻θ指的是确定re传播路径的情况,θja经常用来计算结温,而θjc是不能用来计算结温的(结果会偏大非常多)。
1.2、测试ψ和θ的方法
1.2.1、θJA测量方法:JESD51-2A
芯片厂商一般会要求封装厂仿真得到热阻和热特征参数(环温:85℃),封装厂可以根据JEDEC标准的Test Board(如2s2p PCB板子)或者芯片厂商指定的PCB进行仿真;另外还可以决定是否需要加上散热片进行仿真。
当封装厂直接采用芯片厂商提供的评估板PCB进行热仿真的话,芯片厂商是可以利用θJA来估算结温的。
1.2.2、θJC测量方法:JESD51-14
θJC在仿真或实验的时候,必须保证芯片的Case由温度固定不变的散热片导热(这也就是为什么实际情况下θJC无法用来估算结温的原因)。
2.计算结温的方法
2.1.没有散热片Heat Sink的情形
没有散热片的时候,应该利用ψjt来计算结温:
2.2.有散热片Heat Sink的情形
Ψjt should not be used when application of a heat sink is intended. Instead, following equation should be used.
2.3.几种错误的计算方式
2.3.1.通过θja计算结温
Tj = Ta + θja*Power
TI文档:This is a misapplication of the RθJA thermal parameter because RθJA is a variable function of not just the package, but of many other system level characteristics such as the design and layout of the printed circuit board (PCB) on which the part is mounted. In effect, the test board is a heat sink that is soldered to the leads of the device. Changing the design or configuration of the test board changes the efficiency of the heat sink and therefore the measured RθJA. In fact, in still-air JEDEC-defined RθJA measurements, almost 70%–95% of the power generated by the chip is dissipated from the test board, not from the surfaces of the package. Because a system board rarely approximates the test coupon used to determine RθJA, application of RθJA using Equation 1 results in extremely erroneous values.
尽管TI文档上说,利用θJA来计算结温的时候会因为PCB等因素的影响而不准确,但是,只要PCB等因素差不多,还是可以利用该热阻来估算结温的,并非完全不可取。
2.3.2.通过θjc计算结温
Tj = Tc + θjc*Power
TI文档:The fallacy here is that only a very small percentage of heat energy in a typical plastic package is convected and radiated off the top surface of the package. Many models have shown 60%-95% of thermal energy from a chip is actually convected and radiated off the PCB to which the package is attached. If one assumes the entire power is dissipated by the top surface, the junction temperature calculated by Equation 4 is higher than reality.
3. 举个例子
小明设计了一款产品,但是在热测试的试验中发现某款IC的表面温度较高,使用温度测试仪器量的温度是60℃,此时室温是25℃。而该款产品正常使用环境可能会达到45℃,小明担心产品长期使用存在风险,为了验证这个担忧是否需要,小明需要获得哪些参数,如何计算呢?
Ans:小明首先需要找到该款产品中IC的datasheet或者spec,找到thermal这项中PD、Tj、ψjc等参数。
IC表面最高温度值可以为Tc=Tj-PD*ψjc,
假设PD=1.8W,Tj=125℃,ψjc=5℃,则Tc=125-1.8*5=116℃ >(60-25+45=80℃),
所以,小明的担忧是没有必要的。
当然,考虑到一般IC都会随着温度的上升,其本身的漏电流会增大,从而导致实际的温度比理论推算的要来的大。另外,各个产商为了产品的稳定性,一般都会在结温125℃的基础上作打折扣处理,如九折、八折等。
4. 散热措施
1,加风扇或散热片。
2,IC选型阶段,选择封装较大或者有EPAD等散热较好的IC封装。
3,Layout的时候在IC底部铺铜,并且打上VIA到地,让热量散到GND上去。
4,易发热元件要放置在上风口,易受热影响的元件要与发热元件保持距离甚至是隔离。
5,设计空气流动较好的机构,利于热量对流和辐射。静态空气是不良散热介质,所以必须在机构上开孔增加流通。