Running ATPG Patterns after Tessent Scan
本节介绍如何在使用新命令import_Scan_mode生成ATPG模式时利用Tessent扫描。
当使用import_scan_mode命令时，执行扫描插入的特定扫描模式将作为参数传递。该工具自动读入TCD，并针对特定模式识别需要添加的时钟、要跟踪的扫描链以及要读入和使用的OCC实例（如果适用）。
The import_scan_mode command performs the following tasks:
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Adds scan chains used in the scan mode.
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Adds EDT instruments used in the scan mode.
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Adds OCC instruments used in the scan mode.
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Configures scan clocks used in the scan mode.
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Configures DFT signals used in the scan mode.
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Creates or updates load_unload and shift procedures.
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Adds scan clock pulses to shift procedure.
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Adds scan enable signal forces to shift procedure.
example1：如果正在使用为包装的core，并且在扫描插入过程中使用了edt_mode作为DFT信号，那么将其作为参数传递给import_scan_mode：
>set_context patterns -scan
# Read the library
>read_cell_library ../../library/tessent/adk.tcelllib
>read_cell_library ../../library/mem_ver/memory.lib
# Open all the previous available tsdb_outdirs
>open_tsdb ../tsdb_outdir
# Read the netlist
>read_design cpu_top -design_id gate
>import_scan_mode edt_mode
>set_system_mode analysis
>report_clocks
>report_core_instances
>create_patterns
>write_tsdb_data -replace
# Write out patterns for simulation
>write_patterns ./generated/pat.v -verilog -serial -replace -Begin 0 -End 64
>write_patterns ./generated/pat_parallel.v -verilog -parallel -replace -scan
example2：一个包装的core跑at-speed transition patterns.import_scan_mode传递了内部模式扫描插入期间使用的参数int_mode（这是扫描配置模式）：
>set_context patterns -scan
>set_tsdb_output_directory ../tsdb_outdir
>read_cell_library ../../../library/tessent/adk.tcelllib
>read_design processor_core -design_id gate
>set_current_design processor_core
# Specify a different name than what was used during scan insertion with
# add_scan_mode command
>set_current_mode edt_transition -type internal
>report_dft_signals
>import_scan_mode int_mode -fast_capture_mode on
>set_system_mode analysis
>report_core_instances
>report_clocks
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